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从高角度环形暗场扫描透射电子显微镜(HAADF-STEM)的进展中洞察材料的物理化学性质。

Insights into the physical chemistry of materials from advances in HAADF-STEM.

作者信息

Sohlberg Karl, Pennycook Timothy J, Zhou Wu, Pennycook Stephen J

机构信息

Department of Chemistry, Drexel University, Philadelphia, PA 19104, USA.

出版信息

Phys Chem Chem Phys. 2015 Feb 14;17(6):3982-4006. doi: 10.1039/c4cp04232h.

Abstract

The observation that, "New tools lead to new science"[P. S. Weiss, ACS Nano., 2012, 6(3), 1877-1879], is perhaps nowhere more evident than in scanning transmission electron microscopy (STEM). Advances in STEM have endowed this technique with several powerful and complimentary capabilities. For example, the application of high-angle annular dark-field imaging has made possible real-space imaging at sub-angstrom resolution with Z-contrast (Z = atomic number). Further advances have wrought: simultaneous real-space imaging and elemental identification by using electron energy loss spectroscopy (EELS); 3-dimensional (3D) mapping by depth sectioning; monitoring of surface diffusion by time-sequencing of images; reduced electron energy imaging for probing graphenes; etc. In this paper we review how these advances, often coupled with first-principles theory, have led to interesting and important new insights into the physical chemistry of materials. We then review in detail a few specific applications that highlight some of these STEM capabilities.

摘要

“新工具催生新科学”这一观点(P. S. 韦斯,《美国化学会纳米》,2012年,第6卷第3期,1877 - 1879页),在扫描透射电子显微镜(STEM)领域或许最为明显。STEM的进展赋予了这项技术多种强大且相辅相成的能力。例如,高角度环形暗场成像的应用使得以亚埃分辨率进行具有Z衬度(Z = 原子序数)的实空间成像成为可能。进一步的进展包括:通过电子能量损失谱(EELS)实现同时的实空间成像和元素识别;通过深度切片进行三维(3D)映射;通过图像的时间序列监测表面扩散;用于探测石墨烯的低能电子成像等。在本文中,我们回顾这些进展(通常与第一性原理理论相结合)如何为材料物理化学带来有趣且重要的新见解。然后,我们详细回顾一些突出STEM部分能力的具体应用。

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