Sun Lei, Zhang Jianping, Zhao Feiyu, Luo Xiao, Lv Wenli, li Yao, Ren Qiang, Wen Zhanwei, Peng Yingquan, Liu Xingyuan
Institute of Microelectronics, School of Physical Science and Technology, Lanzhou University, South Tianshui Road 222#, Lanzhou 730000, People's Republic of China.
Nanotechnology. 2015 May 8;26(18):185501. doi: 10.1088/0957-4484/26/18/185501. Epub 2015 Apr 13.
Performances of photoresponsive organic field-effect transistors (photOFETs) operating in the near infrared (NIR) region utilizing SiO2 as the gate dielectric is generally low due to low carrier mobility of the channel. We report on NIR photOFETs based on lead phthalocyanine (PbPc)/C60 heterojunction with ultrahigh photoresponsivity by utilizing poly(vinyl alcohol) (PVA) as the gate dielectric. For 808 nm NIR illumination of 1.69 mW cm(-2), an ultrahigh photoresponsivity of 21 A W(-1), and an external quantum efficiency of 3230% were obtained at a gate voltage of 30 V and a drain voltage of 80 V, which are 124 times and 126 times as large as the reference device with SiO2 as the gate dielectric, respectively. The ultrahigh enhancement of photoresponsivity is resulted from the huge increase of electron mobility of C60 film grown on PVA dielectric. AFM investigations revealed that the C60 film grown on PVA is much smooth and uniform and the grain size is much larger than that grown on SiO2 dielectric, which together results in four orders of magnitude increase of the field-effect electron mobility of C60 film.
由于沟道的载流子迁移率较低,以二氧化硅作为栅极电介质在近红外(NIR)区域工作的光响应有机场效应晶体管(photOFET)的性能通常较低。我们报道了基于铅酞菁(PbPc)/C60异质结的近红外光场效应晶体管,通过使用聚乙烯醇(PVA)作为栅极电介质,具有超高的光响应性。对于1.69 mW cm(-2)的808 nm近红外光照,在30 V的栅极电压和80 V的漏极电压下,获得了21 A W(-1)的超高光响应性和3230%的外量子效率,分别是使用二氧化硅作为栅极电介质的参考器件的124倍和126倍。光响应性的超高增强是由于在PVA电介质上生长的C60薄膜的电子迁移率大幅增加。原子力显微镜(AFM)研究表明,在PVA上生长的C60薄膜更加光滑和均匀,并且晶粒尺寸比在二氧化硅电介质上生长的大得多,这共同导致C60薄膜的场效应电子迁移率增加了四个数量级。