Chen Ying-Chih, Yu Hsin-Chieh, Huang Chun-Yuan, Chung Wen-Lin, Wu San-Lein, Su Yan-Kuin
Institute of Microelectronics and Advanced Optoelectronic Technology Center, National Cheng Kung University, Tainan 701, Taiwan.
Department of Applied Science, National Taitung University, Taitung 950, Taiwan.
Sci Rep. 2015 May 7;5:10022. doi: 10.1038/srep10022.
This study demonstrates the fabrication and characterization of chicken egg albumen-based bio-memristors. By introducing egg albumen as an insulator to fabricate memristor devices comprising a metal/insulator/metal sandwich structure, significant bipolar resistive switching behavior can be observed. The 1/f noise characteristics of the albumen devices were measured, and results suggested that their memory behavior results from the formation and rupture of conductive filaments. Oxygen diffusion and electrochemical redox reaction of metal ions under a sufficiently large electric field are the principal physical mechanisms of the formation and rupture of conductive filaments; these mechanisms were observed by analysis of the time-of-flight secondary ion mass spectrometry (TOF-SIMS) and resistance-temperature (R-T) measurement results. The switching property of the devices remarkably improved by heat-denaturation of proteins; reliable switching endurance of over 500 cycles accompanied by an on/off current ratio (Ion/off) of higher than 10(3) were also observed. Both resistance states could be maintained for a suitably long time (>10(4) s). Taking the results together, the present study reveals for the first time that chicken egg albumen is a promising material for nonvolatile memory applications.
本研究展示了基于鸡蛋白的生物忆阻器的制备与表征。通过引入蛋白作为绝缘体来制备包含金属/绝缘体/金属三明治结构的忆阻器器件，可以观察到显著的双极电阻开关行为。对蛋白器件的1/f噪声特性进行了测量，结果表明其记忆行为源于导电细丝的形成与断裂。在足够大的电场下，氧扩散和金属离子的电化学氧化还原反应是导电细丝形成与断裂的主要物理机制；通过对飞行时间二次离子质谱（TOF-SIMS）和电阻-温度（R-T）测量结果的分析观察到了这些机制。通过蛋白质的热变性，器件的开关特性得到了显著改善；还观察到了超过500次循环的可靠开关耐久性，同时开/关电流比（Ion/off）高于10(3)。两种电阻状态都可以保持适当长的时间（>10(4) s）。综合这些结果，本研究首次揭示鸡蛋白是一种有前途的非易失性存储应用材料。
