Lee Young-Jun, Kim Joo-Hyung, Park Jae-Cheol, Kim Young-Ho, Jung Dongsoo, Kim Tae-Won
J Nanosci Nanotechnol. 2014 Dec;14(12):9285-8. doi: 10.1166/jnn.2014.10110.
We studied Al2O3-doped ZnO (AZO) thin film as a transparent conducting layer for photovoltaic cell operated in wide range of solar spectrum. Effects of substrate temperature on the optical, structural, and electrical properties of thin AZO film were investigated. AZO films were deposited on glass substrates by RF magnetron sputtering system using a 2 wt.% Al2O3 doped target at different temperature conditions. The grown AZO films at low deposition temperatures ranged from 100 degrees C to 300 degrees C show relatively low resistivity, while the samples deposited at 400 degrees C or room temperature are with higher resistivity of -8 x 10(-4) Ω x cm. The measurement by atomic force microscopy reveals that all AZO films possess very smooth surface morphologies with RMS values below 1 nm regardless of substrate temperature. Optical transmittance of the AZO films increases from 81% to 95% as the substrate temperature increases. The AZO films deposited at 200 degrees C condition shows the optimum value of figure-of-merit of 43.7 x 10(-3) Ω(-1), showing the resistivity of 3.4 x 10(-4) Ω x cm and the transmittance of 94%. Additionally, it is noted that the transmittance of the films at near infrared wavelength of 1250 nm exceeds 90%, demonstrating the feasibility as a transparent electrode for thin film solar cell with narrow band gap.
我们研究了Al2O3掺杂的ZnO(AZO)薄膜,将其作为可在宽光谱范围内工作的光伏电池的透明导电层。研究了衬底温度对AZO薄膜光学、结构和电学性能的影响。采用射频磁控溅射系统,使用2 wt.% Al2O3掺杂靶材,在不同温度条件下在玻璃衬底上沉积AZO薄膜。在100℃至300℃的低沉积温度下生长的AZO薄膜显示出相对较低的电阻率,而在400℃或室温下沉积的样品具有-8×10(-4)Ω·cm的较高电阻率。原子力显微镜测量结果表明,无论衬底温度如何,所有AZO薄膜均具有非常光滑的表面形貌,均方根粗糙度值低于1nm。随着衬底温度升高,AZO薄膜的光学透过率从81%增加到95%。在200℃条件下沉积的AZO薄膜的品质因数最佳值为43.7×10(-3)Ω(-1),电阻率为3.4×10(-4)Ω·cm,透过率为94%。此外,值得注意的是,薄膜在1250nm近红外波长处的透过率超过90%,这表明其作为窄带隙薄膜太阳能电池透明电极的可行性。