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扫描量子点显微镜术

Scanning Quantum Dot Microscopy.

作者信息

Wagner Christian, Green Matthew F B, Leinen Philipp, Deilmann Thorsten, Krüger Peter, Rohlfing Michael, Temirov Ruslan, Tautz F Stefan

机构信息

Peter Grünberg Institut (PGI-3), Forschungszentrum Jülich, 52425 Jülich, Germany.

Jülich Aachen Research Alliance (JARA)-Fundamentals of Future Information Technology, 52425 Jülich, Germany.

出版信息

Phys Rev Lett. 2015 Jul 10;115(2):026101. doi: 10.1103/PhysRevLett.115.026101. Epub 2015 Jul 6.

Abstract

We introduce a scanning probe technique that enables three-dimensional imaging of local electrostatic potential fields with subnanometer resolution. Registering single electron charging events of a molecular quantum dot attached to the tip of an atomic force microscope operated at 5 K, equipped with a qPlus tuning fork, we image the quadrupole field of a single molecule. To demonstrate quantitative measurements, we investigate the dipole field of a single metal adatom adsorbed on a metal surface. We show that because of its high sensitivity the technique can probe electrostatic potentials at large distances from their sources, which should allow for the imaging of samples with increased surface roughness.

摘要

我们介绍了一种扫描探针技术,该技术能够以亚纳米分辨率对局部静电势场进行三维成像。通过记录附着在配备qPlus音叉、在5K下运行的原子力显微镜尖端的分子量子点的单电子充电事件,我们对单个分子的四极场进行了成像。为了演示定量测量,我们研究了吸附在金属表面的单个金属吸附原子的偶极场。我们表明,由于其高灵敏度,该技术可以在距源很远的距离探测静电势,这应该能够对表面粗糙度增加的样品进行成像。

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