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用于取出嵌入的部分覆膜自膨式金属支架的支架内支架技术

Stent-in-stent technique for removal of embedded partially covered self-expanding metal stents.

作者信息

DaVee Tomas, Irani Shayan, Leggett Cadman L, Berzosa Corella Manuel, Grooteman Karina V, Wong Kee Song Louis-Michel, Wallace Michael B, Kozarek Richard A, Baron Todd H

机构信息

Gastroenterology, Vanderbilt University, Nashville, TN, USA.

Gastroenterology, Virginia Mason Medical Center, Seattle, WA, USA.

出版信息

Surg Endosc. 2016 Jun;30(6):2332-41. doi: 10.1007/s00464-015-4475-4. Epub 2015 Sep 28.

Abstract

BACKGROUND

Removal of embedded partially covered self-expanding metal stents (PCSEMS) is associated with an increased risk of adverse events compared with removal of fully covered self-expanding stents (FCSES) due to tissue ingrowth. Successful removal of embedded PCSEMS has been described by the stent-in-stent (SIS) technique.

AIMS

To report the first US experience from three high-volume quaternary care centers on the safety and efficacy of the SIS technique for removal of embedded PCSEMS.

METHODS

Retrospective study of outcomes for consecutive patients who underwent the SIS for removal of embedded PCSEMS over a 5-year period.

RESULTS

Twenty-seven embedded PCSEMS were successfully removed using the SIS technique (100 %) from 25 patients (11 males), median age 65 (range 37-80). All stents were successfully removed in one endoscopic session (no repeat SIS procedures were required for persistently embedded stents). The embedded PCSEMS had been in situ for a median of 76 days (range 26-501). Median SIS dwell time (FCSES in situ of PCSEMS) was 13 days (interquartile range 8-16 days; range 4-212 days). One adverse event (self-limited bleeding) occurred during a median follow-up period of 3 months (range 1-32). No patients died, required surgery, or had long-term disability due to adverse events attributed to the SIS technique. Twelve patients required additional interventions following SIS procedure for persistence or recurrence of the underlying pathology.

CONCLUSION

When performed by experienced endoscopists, safe and effective removal of embedded PCSEMS can be achieved via the SIS technique.

摘要

背景

与取出完全覆盖的自膨式支架(FCSES)相比,取出嵌入式部分覆盖自膨式金属支架(PCSEMS)因组织向内生长而导致不良事件风险增加。支架套支架(SIS)技术已被描述用于成功取出嵌入式PCSEMS。

目的

报告美国三家大型四级医疗中心首次使用SIS技术取出嵌入式PCSEMS的安全性和有效性经验。

方法

对连续5年接受SIS技术取出嵌入式PCSEMS的患者结局进行回顾性研究。

结果

使用SIS技术从25例患者(11例男性)中成功取出27个嵌入式PCSEMS(100%),中位年龄65岁(范围37 - 80岁)。所有支架均在一次内镜操作中成功取出(对于持续嵌入的支架无需重复SIS操作)。嵌入式PCSEMS在位中位时间为76天(范围26 - 501天)。SIS中位置入时间(PCSEMS内的FCSES在位时间)为13天(四分位间距8 - 16天;范围4 - 212天)。在中位3个月的随访期(范围1 - 32个月)内发生1例不良事件(自限性出血)。没有患者因SIS技术导致的不良事件死亡、需要手术或出现长期残疾。12例患者在SIS操作后因潜在病变持续或复发需要额外干预。

结论

由经验丰富的内镜医师操作时,通过SIS技术可安全有效地取出嵌入式PCSEMS。

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