Department of Restorative Dentistry, School of Dentistry of Ribeirão Preto, University of São Paulo, Ribeirão Preto, Brazil.
Department of Internal Medicine, Faculty of Medicine of Ribeirão Preto, University of São Paulo, Ribeirão Preto, Brazil.
Int Endod J. 2016 Nov;49(11):1065-1072. doi: 10.1111/iej.12556. Epub 2015 Oct 23.
To evaluate the influence of radiation on root canal sealer push-out bond strength to dentine and sealer/dentine interface in teeth filled with AH Plus (Dentsply Ind. Com. Ltda, Petrópolis, RJ, Brazil) and MTA Fillapex (Angelus Ind. Prod. Odontológicos S/A, Londrina, PR, Brazil).
Thirty-two maxillary canines were selected and randomly assigned to 2 groups (n = 16): one group was not irradiated, and the other was subjected to a cumulative radiation dose of 60 Gy. Root canals were prepared with the Reciproc system (VDW GmbH, Munich, Germany), and each group was divided into 2 subgroups (n = 8) according to the sealer - AH Plus or MTA Fillapex - using the single-cone filling technique. Then, 1-mm-thick dentine slices were obtained from each root third for the push-out test to evaluate sealer bond strength to dentine and for scanning electron microscopy (SEM) to examine the sealer/dentine interface. Failure mode after debonding was determined with a stereomicroscope at ×25 magnification. Bond strength data were analysed by two-way anova with a split-plot design and post hoc Tukey's test (α = 0.05).
Significantly lower bond strength (P < 0.0001) was obtained after irradiation (0.71 ± 0.20 versus 0.97 ± 0.29 MPa) and in specimens filled with MTA Fillapex (0.70 ± 0.18 MPa) compared with AH Plus (1.00 ± 0.27 MPa). Percentage of adhesive failures increased after radiation in all root thirds in the teeth filled with AH Plus. SEM revealed more gap-containing regions and fewer tags at the sealer/dentine interface in irradiated specimens, with more tag formation and fewer gaps with AH Plus sealer.
Radiation was associated with a decrease in the push-out bond strength of sealers to intraradicular dentine and formation of more gaps and fewer tags at the sealer/dentine interface regardless of the sealer.
评估辐射对用 AH Plus(登士柏公司,巴西雷杰斯)和 MTA Fillapex(Angelus 工业生产牙科产品公司,巴西朗多尼亚州)充填的牙齿根管封闭剂与牙本质和封闭剂/牙本质界面的推出粘结强度的影响。
选择 32 颗上颌尖牙,随机分为 2 组(n=16):一组不接受辐射,另一组接受累积剂量 60Gy 的辐射。使用 Reciproc 系统(VDW GmbH,德国慕尼黑)预备根管,根据封闭剂- AH Plus 或 MTA Fillapex ,每组再分为 2 个亚组(n=8),采用单根管充填技术。然后,从每个根的第三部分获得 1mm 厚的牙本质片,用于推出试验以评估封闭剂与牙本质的粘结强度,并进行扫描电子显微镜(SEM)检查封闭剂/牙本质界面。在 ×25 放大倍率的立体显微镜下确定离解后的失效模式。使用双向方差分析和分割区组设计以及事后 Tukey 检验(α=0.05)分析粘结强度数据。
与未辐射组(0.71±0.20MPa)和用 MTA Fillapex 填充的试件(0.70±0.18MPa)相比,辐射后(0.71±0.20MPa)和用 MTA Fillapex 填充的试件的粘结强度显著降低(P<0.0001)。用 AH Plus 填充的牙齿所有根管第三部分的辐射后,黏附性失败的百分比增加。SEM 显示,辐射后试件的封闭剂/牙本质界面中含有更多的间隙和更少的标签,用 AH Plus 封闭剂时则形成更多的标签和更少的间隙。
无论封闭剂如何,辐射都会导致根管封闭剂与根管内牙本质的推出粘结强度降低,并在封闭剂/牙本质界面形成更多的间隙和更少的标签。