Jagtap Amardeep M, Khatei Jayakrishna, Koteswara Rao K S R
Department of Physics, Indian Institute of Science, Bangalore - 560012, India.
Phys Chem Chem Phys. 2015 Nov 7;17(41):27579-87. doi: 10.1039/c5cp04654h.
Naturally formed CdTe/CdS core/shell quantum dot (QD) structures in the presence of surface stabilizing agents have been synthesized by a hydrothermal method. Size and temperature dependent photoluminescence (PL) spectra have been investigated to understand the exciton-phonon interaction, and radiative and nonradiative relaxation of carriers in these QDs. The PL of these aqueous CdTe QDs (3.0-4.8 nm) has been studied in the temperature range 15-300 K. The strength of the exciton-LO-phonon coupling, as reflected in the Huang-Rhys parameter 'S' is found to increase from 1.13 to 1.51 with the QD size varying from 4.8 to 3.0 nm. The PL linewidth (FWHM) increases with increase in temperature and is found to have a maximum in the case of QDs of 3.0 nm in size, where the exciton-acoustic phonon coupling coefficient is enhanced to 51 μeV K(-1), compared to the bulk value of 0.72 μeV K(-1). To understand the nonradiative processes, which affect the relaxation of carriers, the integrated PL intensity is observed as a function of temperature. The integrated PL intensity remains constant until 50 K for relatively large QDs (3.9-4.8 nm) beyond which a thermally activated process takes over. Below 150 K, a small activation energy, 45-19 meV, is found to be responsible for the quenching of the PL. Above 150 K, the thermal escape from the dot assisted by scattering with multiple longitudinal optical (LO) phonons is the main mechanism for the fast quenching of the PL. Besides this high temperature quenching, interestingly for relatively smaller size QDs (3.4-3.0 nm), the PL intensity enhances as the temperature increases up to 90-130 K, which is attributed to the emission of carriers from interface/trap states having an activation energy in the range of 6-13 meV.
采用水热法合成了在表面稳定剂存在下自然形成的CdTe/CdS核壳量子点(QD)结构。研究了尺寸和温度依赖的光致发光(PL)光谱,以了解这些量子点中的激子 - 声子相互作用以及载流子的辐射和非辐射弛豫。在15 - 300 K的温度范围内研究了这些水性CdTe量子点(3.0 - 4.8 nm)的PL。反映在黄 - 里斯参数“S”中的激子 - LO - 声子耦合强度,随着量子点尺寸从4.8 nm变化到3.0 nm,从1.13增加到1.51。PL线宽(半高宽)随温度升高而增加,并且发现在尺寸为3.0 nm的量子点中达到最大值,其中激子 - 声学声子耦合系数增强到51 μeV K⁻¹,而体值为0.72 μeV K⁻¹。为了理解影响载流子弛豫的非辐射过程,观察了积分PL强度随温度的变化。对于相对较大的量子点(3.9 - 4.8 nm),积分PL强度在50 K之前保持恒定,超过此温度后热激活过程占主导。在150 K以下,发现一个小的激活能45 - 19 meV导致PL猝灭。在150 K以上,与多个纵向光学(LO)声子散射辅助的从量子点的热逃逸是PL快速猝灭的主要机制。除了这种高温猝灭外,有趣的是对于相对较小尺寸的量子点(3.4 - 3.0 nm),PL强度在温度升高到90 - 130 K时增强,这归因于具有6 - 13 meV激活能的界面/陷阱态中载流子的发射。