CAS Key Laboratory of Nanosystem and Hierarchical Fabrication, National Center for Nanoscience and Technology , Beijing 100190, China.
University of Chinese Academy of Sciences , No. 19A Yuquan Road, Beijing 100049, China.
Nano Lett. 2015 Nov 11;15(11):7558-66. doi: 10.1021/acs.nanolett.5b03291. Epub 2015 Oct 19.
P-n junctions based on vertically stacked van der Waals (vdW) materials have attracted a great deal of attention and may open up unforeseen opportunities in electronics and optoelectronics. However, due to the lack of intrinsic p-type vdW materials, most previous studies generally adopted electrical gating, special electrode contacts, or chemical doping methods to realize p-n vdW junctions. GaTe is an intrinsic p-type vdW material with a relatively high charge density, and it has a direct band gap that is independent of thickness. Here, we report the construction of ultrathin and tunable p-GaTe/n-MoS2 vdW heterostructure with high photovoltaic and photodetecting performance. The rectification ratio, external quantum efficiency, and photoresponsivity are as high as 4 × 10(5), 61.68%, and 21.83 AW(-1), respectively. In particular, the detectivity is up to 8.4 × 10(13) Jones, which is even higher than commercial Si, InGaAs photodetectors. This study demonstrates the promising potential of p-GaTe/n-MoS2 heterostructures for next-generation electronic and optoelectronic devices.
基于垂直堆叠的范德华(vdW)材料的 p-n 结引起了广泛关注,可能会为电子学和光电子学带来意想不到的机遇。然而,由于缺乏本征的 p 型 vdW 材料,大多数先前的研究通常采用电门控、特殊电极接触或化学掺杂方法来实现 p-n vdW 结。GaTe 是一种本征的 p 型 vdW 材料,具有较高的电荷密度,并且具有与厚度无关的直接带隙。在这里,我们报告了具有高光伏和光电探测性能的超薄和可调谐 p-GaTe/n-MoS2 vdW 异质结的构建。其整流比、外量子效率和光响应率分别高达 4×10(5)、61.68%和 21.83 AW(-1)。特别是,其探测率高达 8.4×10(13)琼斯,甚至高于商用 Si、InGaAs 光电探测器。这项研究表明,p-GaTe/n-MoS2 异质结在下一代电子和光电子器件方面具有广阔的应用前景。