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基于受激辐射损耗的片层照明显微镜轴向分辨率超越衍射极限。

Axial resolution beyond the diffraction limit of a sheet illumination microscope with stimulated emission depletion.

作者信息

Friedrich Mike, Harms Gregory S

机构信息

University of Würzburg, Rudolf Virchow Center, Microscopy Group, Bio-Imaging Center, Josef-Schneider-Str. 2, 97080 Würzburg, Germany.

University of Würzburg, Rudolf Virchow Center, Microscopy Group, Bio-Imaging Center, Josef-Schneider-Str. 2, 97080 Würzburg, GermanybWilkes University, Department of Biology and Physics, Wilkes-Barre, Pennsylvania 18766, United States.

出版信息

J Biomed Opt. 2015 Oct;20(10):106006. doi: 10.1117/1.JBO.20.10.106006.

DOI:10.1117/1.JBO.20.10.106006
PMID:26469565
Abstract

Planar illumination imaging allows for illumination of the focal plane orthogonal to the imaging axis in various light forms and is advantageous for high optical sectioning, high imaging speed, low light exposure, and inherently deeper imaging penetration into small organisms and tissue sections. The drawback of the technique is the low inherent resolution, which can be overcome by the incorporation of a dual-sheet stimulated emission depletion (STED) beam to the planar illumination excitation. Our initiative is the implementation of STED into the planar illumination microscope for enhanced resolution. We demonstrate some of our implementations. The depletion of STED in the microscope follows an inverse square root saturation for up to 2.5-fold axial resolution improvements with both high and low numerical aperture imaging objectives.

摘要

平面照明显微成像允许以各种光形式照射与成像轴正交的焦平面,有利于高光学切片、高成像速度、低光暴露以及对小型生物体和组织切片具有固有的更深成像穿透深度。该技术的缺点是固有分辨率低,通过将双片受激发射损耗(STED)光束并入平面照明激发中可以克服这一缺点。我们的首创是将STED应用于平面照明显微镜以提高分辨率。我们展示了一些我们的应用实例。显微镜中STED的损耗遵循反平方根饱和,对于高数值孔径和低数值孔径成像物镜,轴向分辨率提高可达2.5倍。

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