Vlasin Ondrej, Casals Blai, Dix Nico, Gutiérrez Diego, Sánchez Florencio, Herranz Gervasi
Institut de Ciència de Materials de Barcelona (ICMAB-CSIC), Campus de la UAB, 08193 Bellaterra, Catalonia, Spain.
Sci Rep. 2015 Nov 2;5:15800. doi: 10.1038/srep15800.
We have imaged optically the spatial distributions of ferroelectricity and piezoelectricity at the diffraction limit. Contributions to the birefringence from electro-optics--linked to ferroelectricity--as well as strain--arising from converse piezoelectric effects--have been recorded simultaneously in a BaTiO3 thin film. The concurrent recording of electro-optic and piezo-optic mappings revealed that, far from the ideal uniformity, the ferroelectric and piezoelectric responses were strikingly inhomogeneous, exhibiting significant fluctuations over the scale of the micrometer. The optical methods here described are appropriate to study the variations of these properties simultaneously, which are of great relevance when ferroelectrics are downscaled to small sizes for applications in data storage and processing.
我们已在衍射极限下对铁电性和压电性的空间分布进行了光学成像。在钛酸钡薄膜中,与铁电性相关的电光对双折射的贡献以及由逆压电效应产生的应变已被同时记录下来。电光映射和压光映射的同时记录表明,铁电和压电响应远非理想的均匀状态,而是在微米尺度上呈现出显著的不均匀性,存在明显的波动。这里描述的光学方法适用于同时研究这些特性的变化,当铁电体被缩小到小尺寸用于数据存储和处理应用时,这些变化具有重大意义。