Ghanbari Ebrahim, Wagner Thorsten, Zeppenfeld Peter
Institute of Experimental Physics, Johannes Kepler University , Altenberger Str. 69, 4040 Linz, Austria.
J Phys Chem C Nanomater Interfaces. 2015 Oct 22;119(42):24174-24181. doi: 10.1021/acs.jpcc.5b08083. Epub 2015 Oct 1.
Photoelectron emission microscopy (PEEM) and differential (optical) reflectance spectroscopy (DRS) have proven independently to be versatile analytical tools for monitoring the evolution of organic thin films during growth. In this paper, we present the first experiment in which both techniques have been applied simultaneously and synchronously. We illustrate how the combined PEEM and DRS results can be correlated to obtain an extended perspective on the electronic and optical properties of a molecular film dependent on the film thickness and morphology. As an example, we studied the deposition of the organic molecule α-sexithiophene on Ag(111) in the thickness range from submonolayers up to several monolayers.
光电子发射显微镜（PEEM）和差分（光学）反射光谱（DRS）已分别被证明是用于监测有机薄膜生长过程演变的多功能分析工具。在本文中，我们展示了首次将这两种技术同时且同步应用的实验。我们说明了如何将PEEM和DRS的联合结果相关联，以获得关于分子薄膜的电子和光学性质随薄膜厚度和形态变化的更全面视角。例如，我们研究了有机分子α-六噻吩在Ag(111)上从亚单层到几层单层厚度范围内的沉积情况。
