Department of Electrical Engineering, Columbia University , New York, New York 10027, United States.
Department of Applied Physics and Applied Mathematics, Columbia University , New York, New York 10027, United States.
Nano Lett. 2016 Feb 10;16(2):953-9. doi: 10.1021/acs.nanolett.5b03883. Epub 2016 Jan 20.
Using angle-resolved photoemission on micrometer-scale sample areas, we directly measure the interlayer twist angle-dependent electronic band structure of bilayer molybdenum-disulfide (MoS2). Our measurements, performed on arbitrarily stacked bilayer MoS2 flakes prepared by chemical vapor deposition, provide direct evidence for a downshift of the quasiparticle energy of the valence band at the Brillouin zone center (Γ̅ point) with the interlayer twist angle, up to a maximum of 120 meV at a twist angle of ∼40°. Our direct measurements of the valence band structure enable the extraction of the hole effective mass as a function of the interlayer twist angle. While our results at Γ̅ agree with recently published photoluminescence data, our measurements of the quasiparticle spectrum over the full 2D Brillouin zone reveal a richer and more complicated change in the electronic structure than previously theoretically predicted. The electronic structure measurements reported here, including the evolution of the effective mass with twist-angle, provide new insight into the physics of twisted transition-metal dichalcogenide bilayers and serve as a guide for the practical design of MoS2 optoelectronic and spin-/valley-tronic devices.
利用微区角分辨光电子能谱,我们直接测量了双层二硫化钼(MoS2)的层间扭转角依赖的能带结构。我们的测量是在通过化学气相沉积制备的任意堆叠双层 MoS2 薄片上进行的,为价带在布里渊区中心(Γ̅点)的准粒子能量随层间扭转角的下移提供了直接证据,在扭转角约为 40°时最大可达 120 meV。我们对价带结构的直接测量能够提取出空穴有效质量随层间扭转角的函数关系。虽然我们在 Γ̅点的结果与最近发表的光致发光数据一致,但我们对整个 2D 布里渊区的准粒子谱的测量揭示了电子结构比以前理论预测的更丰富和更复杂的变化。这里报道的电子结构测量,包括有效质量随扭转角的演化,为扭曲过渡金属二硫化物双层的物理性质提供了新的见解,并为 MoS2 光电和自旋/谷电子器件的实际设计提供了指导。