Department of Materials Science and Engineering and Center for 2-Dimensional and Layered Materials, The Pennsylvania State University, University Park, PA 16802, USA.
Department of Physics, Carnegie Mellon University, Pittsburgh, PA 15213, USA.
Nanoscale. 2016 Apr 28;8(16):8947-54. doi: 10.1039/c6nr01902a.
Two-dimensional tungsten diselenide (WSe2) has been used as a component in atomically thin photovoltaic devices, field effect transistors, and tunneling diodes in tandem with graphene. In some applications it is necessary to achieve efficient charge transport across the interface of layered WSe2-graphene, a semiconductor to semimetal junction with a van der Waals (vdW) gap. In such cases, band alignment engineering is required to ensure a low-resistance, ohmic contact. In this work, we investigate the impact of graphene electronic properties on the transport at the WSe2-graphene interface. Electrical transport measurements reveal a lower resistance between WSe2 and fully hydrogenated epitaxial graphene (EG(FH)) compared to WSe2 grown on partially hydrogenated epitaxial graphene (EGPH). Using low-energy electron microscopy and reflectivity on these samples, we extract the work function difference between the WSe2 and graphene and employ a charge transfer model to determine the WSe2 carrier density in both cases. The results indicate that WSe2-EG(FH) displays ohmic behavior at small biases due to a large hole density in the WSe2, whereas WSe2-EG(PH) forms a Schottky barrier junction.
二维二硒化钨 (WSe2) 已被用作原子层薄光伏器件、场效应晶体管和与石墨烯串联的隧道二极管的组成部分。在某些应用中,有必要实现跨层 WSe2-石墨烯界面的有效电荷输运,该界面为具有范德华 (vdW) 间隙的半导体到半金属结。在这种情况下,需要进行能带对准工程以确保低电阻、欧姆接触。在这项工作中,我们研究了石墨烯电子特性对 WSe2-石墨烯界面传输的影响。电输运测量表明,与在部分氢化外延石墨烯 (EGPH) 上生长的 WSe2 相比,WSe2 与完全氢化外延石墨烯 (EG(FH)) 之间的电阻更低。我们使用这些样品的低能电子显微镜和反射率,提取出 WSe2 和石墨烯之间的功函数差,并采用电荷转移模型来确定两种情况下的 WSe2 载流子密度。结果表明,由于 WSe2 中的空穴密度较大,WSe2-EG(FH) 在小偏压下表现出欧姆行为,而 WSe2-EG(PH) 则形成肖特基势垒结。