Balossier G, Garg R K, Bonhomme P, Thomas X
Laboratoire de Microscopie Electronique, U.F.R. Sciences, INSERM U 314, Reims, France.
J Electron Microsc Tech. 1989 Mar;11(3):186-90. doi: 10.1002/jemt.1060110303.
Experimental results obtained by electron diffraction (ED) and extended electron energy loss fine structure (EXELFS) techniques to study the local atomic order in amorphous materials such as carbon, silicon, and its oxides are described. Potential applications of ED and EXELFS techniques and their limitations are also discussed.
描述了通过电子衍射（ED）和扩展电子能量损失精细结构（EXELFS）技术获得的实验结果，这些结果用于研究诸如碳、硅及其氧化物等非晶材料中的局部原子排列。还讨论了ED和EXELFS技术的潜在应用及其局限性。
