Cage M E, Shields S H, Jeffery A
National Institute of Standards and Technology, Gaithersburg, MD 20899-8172.
J Res Natl Inst Stand Technol. 2004 Aug 1;109(4):391-405. doi: 10.6028/jres.109.028. Print 2004 Jul-Aug.
We demonstrate that dc quantized Hall resistance (dc QHR) guideline properties and dc and ac QHR values can be measured without changing sample probe lead connections at the QHR device, and report ac QHR values that converge to the dc QHR value when using four-terminal-pair ac QHR measurements. This was accomplished during one cooldown using single-series and quadruple-series connections outside the sample probe. The QHR was measured from 0 Hz to 5500 Hz in 1:1 ratio at 20 µA to ±1 part in 10(7) uncertainties with a poor-quality QHR device. A good device would allow an order of magnitude smaller uncertainties over this frequency range. We exchanged positions of the QHR device and reference resistor in the bridge and remeasured the resistance ratios to remove dominant ac bridge effects.
我们证明，在不改变量子霍尔电阻（QHR）器件上的样品探针引线连接的情况下，可以测量直流量子化霍尔电阻（dc QHR）的指导特性以及直流和交流QHR值，并报告在使用四端对交流QHR测量时收敛到直流QHR值的交流QHR值。这是在一次冷却过程中，通过在样品探针外部使用单串联和四串联连接完成的。使用质量较差的QHR器件，在20 µA下以1:1的比例从0 Hz到5500 Hz测量QHR，不确定度为±10⁻⁷分之一。一个好的器件在这个频率范围内的不确定度会小一个数量级。我们在电桥中交换了QHR器件和参考电阻的位置，并重新测量电阻比以消除主要的交流电桥效应。
