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从EBT3薄膜到EBT-XD薄膜转变过程中放射变色薄膜光学特性的变化。

Changes of the optical characteristics of radiochromic films in the transition from EBT3 to EBT-XD films.

作者信息

Schoenfeld Andreas A, Wieker Soeren, Harder Dietrich, Poppe Bjoern

机构信息

Clinic of Radiotherapy and Radiation Oncology, Medical Radiation Physics, Pius-Hospital, Carl-von-Ossietzky University, Oldenburg, Germany.

出版信息

Phys Med Biol. 2016 Jul 21;61(14):5426-5442. doi: 10.1088/0031-9155/61/14/5426. Epub 2016 Jul 1.

DOI:10.1088/0031-9155/61/14/5426
PMID:27367839
Abstract

A new type of radiochromic film, the EBT-XD film, has been introduced with the aim to reduce the orientation effect and the lateral response artifact occurring in the use of radiochromic films together with flatbed scanners. The task of the present study is to quantify the changes of optical characteristics involved with the transition from the well-known EBT3 films to the new EBT-XD films, using the optical bench arrangement already applied by Schoenfeld et al (2014 Phys. Med. Biol. 59 3575-97). Largely reduced polarization effects and the almost complete loss of the anisotropy of the scattered light produced in a radiation-exposed film have been observed. The Rayleigh-Debye-Gans theory is used to understand these optical changes as arising from the reduced length-to-width ratio of the LiPCDA polymer crystals in the active layer of the EBT-XD film. The effect of these changes on the flatbed scanning artifacts will be shortly addressed, but treated in more detail in a further paper.

摘要

一种新型的放射变色薄膜,即EBT-XD薄膜已被推出,其目的是减少在将放射变色薄膜与平板扫描仪一起使用时出现的取向效应和横向响应伪影。本研究的任务是使用Schoenfeld等人(2014年,《物理医学与生物学》,第59卷,3575 - 3597页)已经采用的光具座装置,量化从著名的EBT3薄膜过渡到新型EBT-XD薄膜所涉及的光学特性变化。已观察到偏振效应大幅降低,并且在辐射曝光薄膜中产生的散射光的各向异性几乎完全消失。瑞利 - 德拜 - 甘斯理论被用于理解这些光学变化是由EBT-XD薄膜活性层中LiPCDA聚合物晶体的长宽比降低所引起的。这些变化对平板扫描伪影的影响将在短期内提及,但会在后续论文中进行更详细的探讨。

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