原位透射电子显微镜的现状与未来发展方向
Current status and future directions for in situ transmission electron microscopy.
作者信息
Taheri Mitra L, Stach Eric A, Arslan Ilke, Crozier P A, Kabius Bernd C, LaGrange Thomas, Minor Andrew M, Takeda Seiji, Tanase Mihaela, Wagner Jakob B, Sharma Renu
机构信息
Department of Materials Science and Engineering, Drexel University, USA.
Center for Functional Nanomaterials, National Laboratory, Brookhaven, USA.
出版信息
Ultramicroscopy. 2016 Nov;170:86-95. doi: 10.1016/j.ultramic.2016.08.007. Epub 2016 Aug 6.
Abstract
This review article discusses the current and future possibilities for the application of in situ transmission electron microscopy to reveal synthesis pathways and functional mechanisms in complex and nanoscale materials. The findings of a group of scientists, representing academia, government labs and private sector entities (predominantly commercial vendors) during a workshop, held at the Center for Nanoscale Science and Technology- National Institute of Science and Technology (CNST-NIST), are discussed. We provide a comprehensive review of the scientific needs and future instrument and technique developments required to meet them.
摘要
这篇综述文章讨论了原位透射电子显微镜在揭示复杂和纳米级材料的合成途径及功能机制方面的当前及未来应用可能性。文中还讨论了一组来自学术界、政府实验室和私营部门实体（主要是商业供应商）的科学家在纳米尺度科学与技术中心 - 美国国家标准与技术研究院（CNST - NIST）举办的研讨会上的研究成果。我们全面综述了科学需求以及满足这些需求所需的未来仪器和技术发展。
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