Gao Xuan, Casa Diego, Kim Jungho, Gog Thomas, Li Chengyang, Burns Clement
Department of Physics, Western Michigan University, Kalamazoo, Michigan 49008-5252, USA.
Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USA.
Rev Sci Instrum. 2016 Aug;87(8):083107. doi: 10.1063/1.4959566.
Resonant Inelastic X-ray Scattering (RIXS) is a powerful probe for studying electronic excitations in materials. Standard high energy RIXS measurements do not measure the polarization of the scattered x-rays, which is unfortunate since it carries information about the nature and symmetry of the excitations involved in the scattering process. Here we report the fabrication of thin Si-based polarization analyzers with a double-concave toroidal surface, useful for L-edge RIXS studies in heavier atoms such as the 5-d transition metals.
共振非弹性X射线散射（RIXS）是研究材料中电子激发的有力探针。标准的高能RIXS测量不测量散射X射线的偏振，这很遗憾，因为它携带了有关散射过程中激发的性质和对称性的信息。在此，我们报告了具有双凹环形表面的薄硅基偏振分析仪的制造，该分析仪可用于对诸如5-d过渡金属等重原子进行L边RIXS研究。
