动态阻抗谱在原子力显微镜中的应用。
Application of dynamic impedance spectroscopy to atomic force microscopy.
作者信息
Darowicki Kazimierz, Zieliński Artur, J Kurzydłowski Krzysztof
机构信息
Department of Electrochemistry, Corrosion and Materials Engineering, Gdańsk University of Technology, Narutowicza Street 11/12, 80-952 Gdańsk Wrzeszcz, Poland.
Department of Materials Engineering, Warsaw University of Technology, Wołoska Street 144, 02-507 Warsaw, Poland.
出版信息
Sci Technol Adv Mater. 2008 Nov 25;9(4):045006. doi: 10.1088/1468-6996/9/4/045006. eCollection 2008 Dec.
Atomic force microscopy (AFM) is a universal imaging technique, while impedance spectroscopy is a fundamental method of determining the electrical properties of materials. It is useful to combine those techniques to obtain the spatial distribution of an impedance vector. This paper proposes a new combining approach utilizing multifrequency scanning and simultaneous AFM scanning of an investigated surface.
原子力显微镜（AFM）是一种通用的成像技术，而阻抗谱是确定材料电学性质的基本方法。将这些技术结合起来以获得阻抗矢量的空间分布是很有用的。本文提出了一种利用多频扫描和对被研究表面同时进行原子力显微镜扫描的新的结合方法。
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