Samaeeaghmiyoni Vahid, Idrissi Hosni, Groten Jonas, Schwaiger Ruth, Schryvers Dominique
Electron Microscopy for Materials Science (EMAT), Department of Physics, University of Antwerp, Groenenborgerlaan 171, B-2020 Antwerp, Belgium.
Electron Microscopy for Materials Science (EMAT), Department of Physics, University of Antwerp, Groenenborgerlaan 171, B-2020 Antwerp, Belgium; Institute of Mechanics, Materials and Civil Engineering, Université catholique de Louvain, Place Sainte Barbe 2, B-1348 Louvain-la-Neuve, Belgium.
Micron. 2017 Mar;94:66-73. doi: 10.1016/j.micron.2016.12.005. Epub 2016 Dec 21.
Twin-jet electro-polishing and Focused Ion Beam (FIB) were combined to produce small size Nickel single crystal specimens for quantitative in-situ nanotensile experiments in the transmission electron microscope. The combination of these techniques allows producing samples with nearly defect-free zones in the centre in contrast to conventional FIB-prepared samples. Since TEM investigations can be performed on the electro-polished samples prior to in-situ TEM straining, specimens with desired crystallographic orientation and initial microstructure can be prepared. The present results reveal a dislocation nucleation-controlled plasticity, in which small loops induced by FIB near the edges of the samples play a central role.
双喷电解抛光与聚焦离子束（FIB）相结合，制备出小尺寸镍单晶试样，用于在透射电子显微镜中进行定量原位纳米拉伸实验。与传统FIB制备的样品相比，这些技术的结合能够制备出中心区域几乎无缺陷的样品。由于可以在原位TEM拉伸之前对电解抛光后的样品进行TEM研究，因此可以制备出具有所需晶体取向和初始微观结构的试样。目前的结果揭示了一种位错形核控制的塑性，其中FIB在样品边缘附近诱导产生的小位错环起到了核心作用。
