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直接带隙 Ge/GeSn 核/壳纳米线阵列的生长和光学性质。

Growth and Optical Properties of Direct Band Gap Ge/GeSn Core/Shell Nanowire Arrays.

机构信息

Department of Applied Physics, Eindhoven University of Technology , 5600 MB Eindhoven, The Netherlands.

Kavli Institute of Nanoscience, Delft University of Technology , 2600 GA Delft, The Netherlands.

出版信息

Nano Lett. 2017 Mar 8;17(3):1538-1544. doi: 10.1021/acs.nanolett.6b04627. Epub 2017 Feb 9.

Abstract

Group IV semiconductor optoelectronic devices are now possible by using strain-free direct band gap GeSn alloys grown on a Ge/Si virtual substrate with Sn contents above 9%. Here, we demonstrate the growth of Ge/GeSn core/shell nanowire arrays with Sn incorporation up to 13% and without the formation of Sn clusters. The nanowire geometry promotes strain relaxation in the GeSn shell and limits the formation of structural defects. This results in room-temperature photoluminescence centered at 0.465 eV and enhanced absorption above 98%. Therefore, direct band gap GeSn grown in a nanowire geometry holds promise as a low-cost and high-efficiency material for photodetectors operating in the short-wave infrared and thermal imaging devices.

摘要

通过在具有超过 9%Sn 含量的 Ge/Si 虚拟衬底上生长无应变直接带隙 GeSn 合金,现在可以制造 IV 族半导体光电设备。在这里,我们展示了具有高达 13%Sn 掺入且无 Sn 团簇形成的 Ge/GeSn 核/壳纳米线阵列的生长。纳米线几何形状促进了 GeSn 壳中的应变松弛,并限制了结构缺陷的形成。这导致室温下的光致发光中心位于 0.465eV,吸收增强超过 98%。因此,在纳米线几何形状中生长的直接带隙 GeSn 有望成为用于在近红外和热成像器件中工作的低成本、高效率光电探测器的材料。

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