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拉伸锗锡纳米线中锡的平衡极限:对场效应晶体管的影响。

Stretching the Equilibrium Limit of Sn in Ge Sn Nanowires: Implications for Field Effect Transistors.

作者信息

Biswas Subhajit, Doherty Jessica, Galluccio Emmanuele, Manning Hugh G, Conroy Michele, Duffy Ray, Bangert Ursel, Boland John J, Holmes Justin D

机构信息

School of Chemistry and Advanced Materials and Bioengineering Research (AMBER) Centre, University College Cork, Cork T12 YN60, Ireland.

Tyndall National Institute, University College Cork, Cork T12 R5CP, Ireland.

出版信息

ACS Appl Nano Mater. 2021 Feb 26;4(2):1048-1056. doi: 10.1021/acsanm.0c02569. Epub 2021 Feb 3.

Abstract

Ge Sn nanowires incorporating a large amount of Sn would be useful for mobility enhancement in nanoelectronic devices, a definitive transition to a direct bandgap for application in optoelectronic devices and to increase the efficiency of the GeSn-based photonic devices. Here we report the catalytic bottom-up fabrication of Ge Sn nanowires with very high Sn incorporation ( > 0.3). These nanowires are grown in supercritical toluene under high pressure (21 MPa). The introduction of high pressure in the vapor-liquid-solid (VLS) like growth regime resulted in a substantial increase of Sn incorporation in the nanowires, with a Sn content ranging between 10 and 35 atom %. The incorporation of Sn in the nanowires was found to be inversely related to nanowire diameter; a high Sn content of 35 atom % was achieved in very thin Ge Sn nanowires with diameters close to 20 nm. Sn was found to be homogeneously distributed throughout the body of the nanowires, without apparent clustering or segregation. The large inclusion of Sn in the nanowires could be attributed to the nanowire growth kinetics and small nanowire diameters, resulting in increased solubility of Sn in Ge at the metastable liquid-solid interface under high pressure. Electrical investigation of the Ge Sn ( = 0.10) nanowires synthesized by the supercritical fluid approach revealed their potential in nanoelectronics and sensor-based applications.

摘要

含有大量锡的锗锡纳米线对于提高纳米电子器件的迁移率、向直接带隙的确定性转变以用于光电器件以及提高基于锗锡的光子器件的效率将是有用的。在此,我们报告了具有非常高锡掺入量(>0.3)的锗锡纳米线的催化自下而上制备方法。这些纳米线在超临界甲苯中于高压(21兆帕)下生长。在类似气液固(VLS)的生长模式中引入高压导致纳米线中锡掺入量大幅增加,锡含量在10%至35原子%之间。发现纳米线中锡的掺入量与纳米线直径成反比;在直径接近20纳米的非常细的锗锡纳米线中实现了35原子%的高锡含量。发现锡在纳米线主体中均匀分布,没有明显的聚集或偏析。纳米线中大量掺入锡可归因于纳米线的生长动力学和较小的纳米线直径导致在高压下亚稳态液固界面处锡在锗中的溶解度增加。对通过超临界流体方法合成的锗锡(=0.10)纳米线的电学研究揭示了它们在纳米电子学和基于传感器的应用中的潜力。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/399d/8153542/a8fad32721da/an0c02569_0001.jpg

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