Key Laboratory for NeuroInformation of Ministry of Education, School of Life Science and Technology, University of Electronic Science and Technology of China, Chengdu, China.
Faculty of Psychological and Educational Sciences, Department of Experimental and Applied Psychology, Research Group of Biological Psychology, Vrije Universiteit Brussel, Brussels, Belgium.
Brain Imaging Behav. 2018 Apr;12(2):335-344. doi: 10.1007/s11682-017-9692-0.
Working memory (WM) deficit is a core feature of schizophrenia and is characterized by abnormal functional integration in the prefrontal cortex, including the dorsolateral prefrontal cortex (dLPFC), dorsal anterior cingulate cortex (dACC), and ventrolateral prefrontal cortex (vLPFC). However, the specific mechanism by which the abnormal neuronal circuits that involve these brain regions contribute to this deficit is still unclear. Therefore, this study focused on these regions and sought to answer which abnormal causal relationships in these regions can be linked to impaired WM in schizophrenia. We used spectral dynamic causal modeling to estimate directed (effective) connectivity between these regions based on resting-state functional magnetic resonance imaging data from healthy control (HC) subjects and patients with first-episode schizophrenia (FES). By comparing these effective connections in the controls and patients, we found that the effective connectivity from the dACC to the dLPFC and from the right dLPFC to the left vLPFC was weaker in the FES group than in the HC group. Furthermore, these effective connections displayed a positive correlation with WM performance in the HCs. However, in the FES patients, the effective connectivity from the dACC to the dLPFC was not correlated with WM performance, and the effective connectivity from the right dLPFC to the left vLPFC was negatively correlated with WM performance. These results could be explained by an aberrant top-down mechanism of WM processing and provide new evidence for the dysconnectivity hypothesis of schizophrenia.
工作记忆(WM)缺陷是精神分裂症的核心特征,其特征是前额叶皮层(包括背外侧前额叶皮层(dLPFC)、背侧前扣带皮层(dACC)和腹外侧前额叶皮层(vLPFC))的功能异常整合。然而,涉及这些大脑区域的异常神经元回路如何导致这种缺陷的具体机制仍不清楚。因此,本研究集中在这些区域,并试图回答这些区域中哪些异常因果关系可以与精神分裂症患者的 WM 受损相关。我们使用谱动态因果建模来根据健康对照组(HC)和首发精神分裂症(FES)患者的静息态功能磁共振成像数据来估计这些区域之间的定向(有效)连接。通过比较对照组和患者之间的这些有效连接,我们发现 FES 组中 dACC 到 dLPFC 的有效连接以及右侧 dLPFC 到左侧 vLPFC 的有效连接比 HC 组弱。此外,这些有效连接与 HCs 的 WM 表现呈正相关。然而,在 FES 患者中,dACC 到 dLPFC 的有效连接与 WM 表现不相关,而右侧 dLPFC 到左侧 vLPFC 的有效连接与 WM 表现呈负相关。这些结果可以用 WM 处理的异常自上而下机制来解释,并为精神分裂症的连接异常假说提供新的证据。