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低温原子层沉积 MoS 薄膜。

Low-Temperature Atomic Layer Deposition of MoS Films.

机构信息

Department of Chemistry and the Materials Research Center, Northwestern University, 2145 Sheridan Road, Evanston, IL, 60208, USA.

Department of Materials Science and Engineering, and the Materials Research Center, Northwestern University, 2220 Campus Dr., Evanston, IL, 60208, USA.

出版信息

Angew Chem Int Ed Engl. 2017 Apr 24;56(18):4991-4995. doi: 10.1002/anie.201611838. Epub 2017 Apr 3.

Abstract

Wet chemical screening reveals the very high reactivity of Mo(NMe ) with H S for the low-temperature synthesis of MoS . This observation motivated an investigation of Mo(NMe ) as a volatile precursor for the atomic layer deposition (ALD) of MoS thin films. Herein we report that Mo(NMe ) enables MoS film growth at record low temperatures-as low as 60 °C. The as-deposited films are amorphous but can be readily crystallized by annealing. Importantly, the low ALD growth temperature is compatible with photolithographic and lift-off patterning for the straightforward fabrication of diverse device structures.

摘要

湿化学筛选表明,Mo(NMe2)与 H2S 的反应非常活跃,可用于低温合成 MoS2。这一观察结果促使我们研究 Mo(NMe2)作为 MoS 薄膜原子层沉积 (ALD)的挥发性前体。在此,我们报告 Mo(NMe2)可实现 MoS 薄膜在创纪录的低温下生长,低至 60°C。沉积的薄膜是无定形的,但通过退火可以很容易地结晶。重要的是,低的 ALD 生长温度与光刻和剥离图案化兼容,可用于各种器件结构的简单制造。

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