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基于横向介孔 GaN 的高灵敏度紫外光电探测器。

High-detectivity ultraviolet photodetectors based on laterally mesoporous GaN.

机构信息

Semiconductor Lighting Research and Development Center, Institute of Semiconductors, Chinese Academy of Sciences, A35 Qinghua East Road, Haidian District, Beijing, 100083, P. R. China.

出版信息

Nanoscale. 2017 Jun 22;9(24):8142-8148. doi: 10.1039/c7nr01290j.

Abstract

Photodetectors for the ultraviolet (UV) range of the electromagnetic spectrum are in great demand for several technologies, but require the development of novel device structures and materials. Here we report on the high detectivity of UV photodetectors based on well-ordered laterally mesoporous GaN. The specific detectivity of our devices under UV-illumination reaches values of up to 5.3 × 10 Jones. We attribute this high specific detectivity to the properties of the mesoporous GaN/metal contact interface: the trapping of photo-generated holes at the interface lowers the Schottky barrier height thus causing a large internal gain. High detectivity along with a simple fabrication process endows these laterally mesoporous GaN photodetectors with great potential for applications that require selective detection of weak optical signals in the UV range.

摘要

用于电磁光谱紫外线 (UV) 范围的光电探测器在许多技术中都有很大的需求,但需要开发新型器件结构和材料。在这里,我们报告了基于有序横向介孔 GaN 的 UV 光电探测器的高探测率。我们的器件在紫外光照射下的比探测率高达 5.3×10^10 Jones。我们将这种高比探测率归因于介孔 GaN/金属接触界面的性质:界面处光生空穴的俘获降低了肖特基势垒高度,从而导致了大的内部增益。高探测率加上简单的制造工艺使这些横向介孔 GaN 光电探测器具有很大的潜力,可用于需要选择性检测 UV 范围内弱光信号的应用。

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