Ryu Min-Yeul, Jang Ho-Kyun, Lee Kook Jin, Piao Mingxing, Ko Seung-Pil, Shin Minju, Huh Junghwan, Kim Gyu-Tae
School of Electrical Engineering, Korea University, Seoul 02481, South Korea.
Phys Chem Chem Phys. 2017 May 24;19(20):13133-13139. doi: 10.1039/c7cp00589j.
Chemical doping has been investigated as an alternative method of conventional ion implantation for two-dimensional materials. We herein report chemically doped multilayer molybdenum disulfide (MoS) field effect transistors (FETs) through n-type channel doping, wherein triethanolamine (TEOA) is used as an n-type dopant. As a result of the TEOA doping process, the electrical performances of multilayer MoS FETs were enhanced at room temperature. Extracted field effect mobility was estimated to be ∼30 cm V s after the surface doping process, which is 10 times higher than that of the pristine device. Subthreshold swing and contact resistance were also improved after the TEOA doping process. The enhancement of the subthreshold swing was demonstrated by using an independent FET model. Furthermore, we found that the doping level can be effectively controlled by the heat treatment method. These results demonstrate a promising material system that is easily controlled with high performance, while elucidating the underlying mechanism of improved electrical properties by the doping effect in a multilayered scheme.
化学掺杂已被作为二维材料传统离子注入的一种替代方法进行研究。我们在此报告通过n型沟道掺杂的化学掺杂多层二硫化钼(MoS)场效应晶体管(FET),其中三乙醇胺(TEOA)用作n型掺杂剂。由于TEOA掺杂过程,多层MoS FET的电学性能在室温下得到增强。表面掺杂过程后提取的场效应迁移率估计约为30 cm² V⁻¹ s⁻¹,比原始器件高10倍。TEOA掺杂过程后亚阈值摆幅和接触电阻也得到改善。通过使用独立的FET模型证明了亚阈值摆幅的增强。此外,我们发现掺杂水平可以通过热处理方法有效控制。这些结果证明了一种有前景的材料系统,该系统易于控制且具有高性能,同时阐明了多层结构中掺杂效应改善电学性能的潜在机制。