Xue Peiyu, Zhao Yue, Wen Chengrong, Cheng Sheng, Lin Songyi
School of Food Science and Technology, Dalian Polytechnic University, National Engineering Research Center of Seafood, Dalian 116034, PR China.
Test Instrument Center of Dalian Polytechnic University, Dalian 116034, PR China.
Food Chem. 2017 Oct 15;233:467-475. doi: 10.1016/j.foodchem.2017.04.152. Epub 2017 Apr 27.
The properties and viscosity-reduction mechanism of corn flour irradiated by electron beam have not been understood properly. Here, we investigate the effects of electron beam irradiation (EBI) on the gelatinization and physicochemical properties of corn flour irradiated by 0-5.40kGy of electron beam. The total starch and crude fiber contents of corn flour decreased significantly (P<0.05) after EBI treatment, while the moisture and reducing sugar contents increased significantly (P<0.05). EBI caused perforations on the corn flour particle surfaces, and the irradiated parts of the particles would gradually peel off and afford smooth surfaces, spherical structures, and smaller sizes. Molecular chains of corn flour broke owing to EBI. After irradiation, the pasting peak viscosity decreased dramatically (P<0.01) from 1251.74 to 7.16Pa·s, showing that the gelatinization of corn flour was completely inhibited. Thus, EBI can be used to inhibit the gelatinization of corn flour, which may be beneficial for industrial and food formulations.
电子束辐照玉米粉的特性及降黏机理尚未得到充分理解。在此，我们研究了电子束辐照（EBI）对经0 - 5.40kGy电子束辐照的玉米粉糊化及理化性质的影响。EBI处理后，玉米粉的总淀粉和粗纤维含量显著降低（P<0.05），而水分和还原糖含量显著增加（P<0.05）。EBI导致玉米粉颗粒表面出现穿孔，颗粒的辐照部分会逐渐剥落，形成光滑表面、球形结构且尺寸变小。玉米粉的分子链因EBI而断裂。辐照后，糊化峰值黏度从1251.74急剧降至7.16Pa·s（P<0.01），表明玉米粉的糊化被完全抑制。因此，EBI可用于抑制玉米粉的糊化，这可能对工业和食品配方有益。
