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通过共振测量研究 BiSe 纳米带的杨氏模量和间接形态分析。

Young's modulus and indirect morphological analysis of BiSe nanoribbons by resonance measurements.

机构信息

Institute of Chemical Physics, University of Latvia, 19 Raina blvd., Riga, LV-1586, Latvia.

出版信息

Nanotechnology. 2017 Aug 11;28(32):325701. doi: 10.1088/1361-6528/aa79cd. Epub 2017 Jun 15.

Abstract

An electrostatically induced resonance behaviour of individual topological insulator BiSe nanoribbons grown by a catalyst free vapour-solid synthesis was studied in situ by scanning electron microscopy. It was demonstrated that the relation between the resonant frequencies of vibrations in orthogonal planes can be applied to distinguish the nanoribbons with rectangular cross-sections from the nanoribbons having step-like morphology (terraces). The average Young's modulus of the BiSe nanoribbons with rectangular cross-sections was found to be 44 ± 4 GPa.

摘要

通过无催化剂的气相-固相合成方法生长的单个拓扑绝缘体 BiSe 纳米带的静电感应共振行为通过扫描电子显微镜进行了原位研究。结果表明,正交平面振动的共振频率之间的关系可用于区分具有矩形横截面的纳米带与具有阶跃状形态(平台)的纳米带。具有矩形横截面的 BiSe 纳米带的平均杨氏模量为 44 ± 4 GPa。

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