State Key Laboratory of Heavy Oil Processing, China University of Petroleum, Qingdao 266580, Shandong, P. R. China.
Nanoscale. 2017 Jun 29;9(25):8848-8857. doi: 10.1039/c7nr03437g.
The SnO/Si heterojunction possesses a large band offset and it is easy to control the transportation of carriers in the SnO/Si heterojunction to realize high-response broadband detection. Therefore, we investigated the potential of the SnO nanoparticle thin film/SiO/p-Si heterojunction for photodetectors. It is demonstrated that this heterojunction shows a stable, repeatable and broadband photoresponse from 365 nm to 980 nm. Meanwhile, the responsivity of the device approaches a high value in the range of 0.285-0.355 A W with the outstanding detectivity of ∼2.66 × 10 cm H W and excellent sensitivity of ∼1.8 × 10 cm W, and its response and recovery times are extremely short (<0.1 s). This performance makes the device stand out among previously reported oxide or oxide/Si based photodetectors. In fact, the photosensitivity and detectivity of this heterojunction are an order of magnitude higher than that of 2D material based heterojunctions such as (BiTe)/Si and MoS/graphene (photosensitivity of 7.5 × 10 cm W and detectivity of ∼2.5 × 10 cm H W). The excellent device performance is attributed to the large Fermi energy difference between the SnO nanoparticle thin film and Si, SnO nanostructure, oxygen vacancy defects and thin SiO layer. Consequently, practical highly-responsive broadband PDs may be actualized in the future.
SnO/Si 异质结具有较大的能带偏移,并且易于控制 SnO/Si 异质结中载流子的输运,以实现高响应的宽带检测。因此,我们研究了 SnO 纳米颗粒薄膜/SiO/p-Si 异质结在光电探测器中的应用潜力。结果表明,该异质结在 365nm 至 980nm 的范围内表现出稳定、可重复和宽带的光电响应。同时,该器件的响应率在 0.285-0.355A W 的范围内接近高值,具有出色的探测率约为 2.66×10 cm H W 和优异的灵敏度约为 1.8×10 cm W,其响应和恢复时间极短(<0.1s)。这种性能使该器件在之前报道的氧化物或氧化物/Si 基光电探测器中脱颖而出。事实上,该异质结的光灵敏度和探测率比二维材料基异质结(如(BiTe)/Si 和 MoS/graphene)高出一个数量级(光灵敏度为 7.5×10 cm W,探测率约为 2.5×10 cm H W)。优异的器件性能归因于 SnO 纳米颗粒薄膜与 Si 之间较大的费米能级差、SnO 纳米结构、氧空位缺陷和薄的 SiO 层。因此,未来可能实现实际的高响应宽带 PDs。