Cui J, Yao Y, Wang Y G, Shen X, Yu R C
Beijing National Laboratory of Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China; School of Physical Sciences, University of Chinese Academy of Science, Beijing 100049, China.
Beijing National Laboratory of Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China.
Ultramicroscopy. 2017 Nov;182:156-162. doi: 10.1016/j.ultramic.2017.07.007. Epub 2017 Jul 3.
The effect of the tilt of the crystallographic orientation with respect to an incident electron probe on high-angle annular dark field (HAADF) imaging in aberration-corrected scanning transmission electron microscopy (STEM) is investigated in experiment and simulation. A small specimen tilt can lead to unequal deviations of different atom species in the HAADF image and result in further relative displacement between anion and cation. Simulated HAADF images also confirm that the crystal tilt causes an artifact in atom polarization. The effect is derived from the scattering abilities of different atoms.
在实验和模拟中研究了晶体取向相对于入射电子探针的倾斜对像差校正扫描透射电子显微镜（STEM）中的高角度环形暗场（HAADF）成像的影响。小的样品倾斜会导致HAADF图像中不同原子种类的偏差不均等，并导致阴离子和阳离子之间进一步的相对位移。模拟的HAADF图像也证实了晶体倾斜会导致原子极化出现伪像。这种效应源自不同原子的散射能力。
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