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开源自动映射四点探针。

Open-Source Automated Mapping Four-Point Probe.

作者信息

Chandra Handy, Allen Spencer W, Oberloier Shane W, Bihari Nupur, Gwamuri Jephias, Pearce Joshua M

机构信息

Department of Electrical and Computer Engineering, Michigan Technological University, Houghton, MI 49931, USA.

Department of Materials Science and Engineering, Michigan Technological University, Houghton, MI 49931, USA.

出版信息

Materials (Basel). 2017 Jan 26;10(2):110. doi: 10.3390/ma10020110.

Abstract

Scientists have begun using self-replicating rapid prototyper (RepRap) 3-D printers to manufacture open source digital designs of scientific equipment. This approach is refined here to develop a novel instrument capable of performing automated large-area four-point probe measurements. The designs for conversion of a RepRap 3-D printer to a 2-D open source four-point probe (OS4PP) measurement device are detailed for the mechanical and electrical systems. Free and open source software and firmware are developed to operate the tool. The OS4PP was validated against a wide range of discrete resistors and indium tin oxide (ITO) samples of different thicknesses both pre- and post-annealing. The OS4PP was then compared to two commercial proprietary systems. Results of resistors from 10 to 1 MΩ show errors of less than 1% for the OS4PP. The 3-D mapping of sheet resistance of ITO samples successfully demonstrated the automated capability to measure non-uniformities in large-area samples. The results indicate that all measured values are within the same order of magnitude when compared to two proprietary measurement systems. In conclusion, the OS4PP system, which costs less than 70% of manual proprietary systems, is comparable electrically while offering automated 100 micron positional accuracy for measuring sheet resistance over larger areas.

摘要

科学家们已开始使用自我复制快速成型机(RepRap)3D打印机来制造科学设备的开源数字设计。在此对该方法进行改进,以开发一种能够进行自动大面积四点探针测量的新型仪器。详细介绍了将RepRap 3D打印机转换为二维开源四点探针(OS4PP)测量设备的机械和电气系统设计。开发了免费的开源软件和固件来操作该工具。针对各种不同厚度的离散电阻器和退火前后的氧化铟锡(ITO)样品对OS4PP进行了验证。然后将OS4PP与两个商业专有系统进行比较。10至1MΩ电阻器的测量结果表明,OS4PP的误差小于1%。ITO样品薄层电阻的三维映射成功展示了测量大面积样品不均匀性的自动化能力。结果表明,与两个专有测量系统相比,所有测量值都在同一数量级内。总之,OS4PP系统的成本不到手动专有系统的70%,在电气性能上相当,同时在大面积测量薄层电阻时提供100微米的自动定位精度。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/c49b/5459207/7c13b95b6a76/materials-10-00110-g001.jpg

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