通过X射线光电子能谱和飞行时间二次离子质谱对聚合物共混物进行表面表征

Surface Characterization of Polymer Blends by XPS and ToF-SIMS.

作者信息

Chan Chi Ming, Weng Lu-Tao

机构信息

Division of Environment, Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong, China.

Department of Chemical and Biomolecular Engineering, Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong, China.

出版信息

Materials (Basel). 2016 Aug 4;9(8):655. doi: 10.3390/ma9080655.

The surface properties of polymer blends are important for many industrial applications. The physical and chemical properties at the surface of polymer blends can be drastically different from those in the bulk due to the surface segregation of the low surface energy component. X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary mass spectrometry (ToF-SIMS) have been widely used to characterize surface and bulk properties. This review provides a brief introduction to the principles of XPS and ToF-SIMS and their application to the study of the surface physical and chemical properties of polymer blends.