Lee Jihye, Kang Min Hwa, Lee Kang-Bong, Lee Yeonhee
Advanced Analysis Center, Korea Institute of Science and Technology, Seoul 136-791, Korea.
Department of Nano and Bio Surface Science, University of Science and Technology, Daejeon 305-350, Korea.
Materials (Basel). 2013 May 15;6(5):2007-2025. doi: 10.3390/ma6052007.
Time-of-flight secondary ion mass spectrometry (TOF-SIMS) and X-ray photoelectron spectroscopy (XPS) are well established surface techniques that provide both elemental and organic information from several monolayers of a sample surface, while also allowing depth profiling or image mapping to be carried out. The static TOF-SIMS with improved performances has expanded the application of TOF-SIMS to the study of a variety of organic, polymeric and biological materials. In this work, TOF-SIMS, XPS and Fourier Transform Infrared (FTIR) measurements were used to characterize commercial natural dyes and traditional silk fabric dyed with plant extracts dyes avoiding the time-consuming and destructive extraction procedures necessary for the spectrophotometric and chromatographic methods previously used. Silk textiles dyed with plant extracts were then analyzed for chemical and functional group identification of their dye components and mordants. TOF-SIMS spectra for the dyed silk fabric showed element ions from metallic mordants, specific fragment ions and molecular ions from plant-extracted dyes. The results of TOF-SIMS, XPS and FTIR are very useful as a reference database for comparison with data about traditional Korean silk fabric and to provide an understanding of traditional dyeing materials. Therefore, this study shows that surface techniques are useful for micro-destructive analysis of plant-extracted dyes and Korean dyed silk fabric.
飞行时间二次离子质谱（TOF-SIMS）和X射线光电子能谱（XPS）是成熟的表面分析技术，可提供样品表面几个单分子层的元素和有机信息，同时还能进行深度剖析或成像映射。性能得到改进的静态TOF-SIMS扩展了TOF-SIMS在各种有机、聚合物和生物材料研究中的应用。在本工作中，使用TOF-SIMS、XPS和傅里叶变换红外光谱（FTIR）对商用天然染料以及用植物提取物染料染色的传统丝绸织物进行表征，避免了先前使用的分光光度法和色谱法所需的耗时且具有破坏性的提取过程。然后对用植物提取物染色的丝绸纺织品进行分析，以鉴定其染料成分和媒染剂的化学组成及官能团。染色丝绸织物的TOF-SIMS光谱显示了来自金属媒染剂的元素离子、来自植物提取物染料的特定碎片离子和分子离子。TOF-SIMS、XPS和FTIR的结果作为与韩国传统丝绸织物数据进行比较的参考数据库非常有用，有助于了解传统染色材料。因此，本研究表明表面分析技术对于植物提取物染料和韩国染色丝绸织物的微损分析很有用。
