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氢钝化对石墨烯在 SiC(0001)衬底上解耦的影响:第一性原理计算。

Effect of hydrogen passivation on the decoupling of graphene on SiC(0001) substrate: First-principles calculations.

机构信息

Hunan Key Laboratory of Micro-Nano Energy Materials and Devices, Xiangtan University, Hunan, 411105, P. R. China.

Laboratory for Quantum Engineering and Micro-Nano Energy Technology and School of Physics and Optoelectronics, Xiangtan University, Hunan, 411105, P. R. China.

出版信息

Sci Rep. 2017 Aug 16;7(1):8461. doi: 10.1038/s41598-017-09161-w.

Abstract

Intercalation of hydrogen is important for understanding the decoupling of graphene from SiC(0001) substrate. Employing first-principles calculations, we have systematically studied the decoupling of graphene from SiC surface by H atoms intercalation from graphene boundary. It is found the passivation of H atoms on both graphene edge and SiC substrate is the key factor of the decoupling process. Passivation of graphene edge can weaken the interaction between graphene boundary and the substrate, which reduced the energy barrier significantly for H diffusion into the graphene-SiC interface. As more and more H atoms diffuse into the interface and saturate the Si dangling bonds around the boundary, graphene will detach from substrate. Furthermore, the energy barriers in these processes are relatively low, indicating that these processes can occur under the experimental temperature.

摘要

氢的嵌入对于理解石墨烯与 SiC(0001) 衬底的解耦很重要。我们采用第一性原理计算,系统地研究了通过从石墨烯边界嵌入 H 原子使石墨烯从 SiC 表面解耦。结果发现,H 原子在石墨烯边缘和 SiC 衬底上的钝化是解耦过程的关键因素。钝化石墨烯边缘可以减弱石墨烯边界与衬底之间的相互作用,从而显著降低 H 原子扩散到石墨烯-SiC 界面的能垒。随着越来越多的 H 原子扩散到界面并饱和边界周围的 Si 悬挂键,石墨烯将从衬底上脱离。此外,这些过程中的能垒相对较低,表明这些过程可以在实验温度下发生。

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