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铁电晶体中的畴建模与畴成像技术综述

A Review of Domain Modelling and Domain Imaging Techniques in Ferroelectric Crystals.

作者信息

Potnis Prashant R, Tsou Nien-Ti, Huber John E

机构信息

Department of Engineering Science, University of Oxford, Parks Road, Oxford, OX1 3PJ, UK.

出版信息

Materials (Basel). 2011 Feb 16;4(2):417-447. doi: 10.3390/ma4020417.

Abstract

The present paper reviews models of domain structure in ferroelectric crystals, thin films and bulk materials. Common crystal structures in ferroelectric materials are described and the theory of compatible domain patterns is introduced. Applications to multi-rank laminates are presented. Alternative models employing phase-field and related techniques are reviewed. The paper then presents methods of observing ferroelectric domain structure, including optical, polarized light, scanning electron microscopy, X-ray and neutron diffraction, atomic force microscopy and piezo-force microscopy. Use of more than one technique for unambiguous identification of the domain structure is also described.

摘要

本文综述了铁电晶体、薄膜和块状材料中的畴结构模型。描述了铁电材料中常见的晶体结构,并介绍了相容畴图案理论。还介绍了其在多秩层压板中的应用。综述了采用相场及相关技术的替代模型。然后本文介绍了观察铁电畴结构的方法,包括光学、偏振光、扫描电子显微镜、X射线和中子衍射、原子力显微镜和压电力显微镜。还描述了使用多种技术来明确识别畴结构的方法。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/1e40/5448488/e49e5d89574d/materials-04-00417-g001.jpg

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