Li Jianfei, Li Changfu, Xu Mingsheng, Ji Ziwu, Shi Kaiju, Xu Xinglian, Li Hongbin, Xu Xiangang
Opt Express. 2017 Oct 2;25(20):A871-A879. doi: 10.1364/OE.25.00A871.
Injection current, and temperature, dependences of the electroluminescence (EL) spectrum from green InGaN/GaN multiple quantum well (MQW)-based light-emitting diodes (LED) grown on a Si substrate, are investigated over a wide range of injection currents (0.5 µA-350 mA) and temperatures (6-350 K). The results show that an increasing temperature can result in the change of injection current-dependent behavior of the EL spectrum in initial current range. That is, with increasing the injection current in the low current range, the emission process of the MQWs is dominated by filling effect of low-energetic localized states at the low temperature range of around 6 K, and by Coulomb screening of the quantum confinement Stark effect followed by a filling effect of the higher levels of the low-energetic localized states at the intermediate temperature range of around 160 K. However, when the temperature is further raised to the higher temperature range of around 350 K, the emission process of the MQWs in the low current range is dominated by carrier-scattering effect followed by non-radiative recombination process. The aforementioned current-dependent behaviors of the EL spectrum are mainly attributed to the strong localized effect of the green LED, as confirmed by the anomalous temperature dependence of the EL spectrum measured at the low injection current of 5 µA. In addition, the injection current dependence of external quantum efficiency at different temperatures shows that, with increasing temperature from 6 to 350 K, in addition to the enhanced non-radiative recombination, electron overflow becomes more significant, especially in the higher temperature range above 300 K.
研究了在硅衬底上生长的基于绿色氮化铟镓/氮化镓多量子阱(MQW)的发光二极管(LED)的电致发光(EL)光谱随注入电流和温度的变化关系,测量范围包括宽范围的注入电流(0.5 μA - 350 mA)和温度(6 - 350 K)。结果表明,在初始电流范围内,温度升高会导致EL光谱的注入电流依赖性行为发生变化。即在低电流范围内增加注入电流时,在约6 K的低温范围内,多量子阱的发光过程主要由低能局域态的填充效应主导;在约160 K的中间温度范围内,由量子限制斯塔克效应的库仑屏蔽以及随后低能局域态较高能级的填充效应主导。然而,当温度进一步升高到约350 K的高温范围时,低电流范围内多量子阱的发光过程由载流子散射效应以及随后的非辐射复合过程主导。上述EL光谱的电流依赖性行为主要归因于绿色LED的强局域效应,这在5 μA低注入电流下测量的EL光谱的异常温度依赖性中得到证实。此外,不同温度下外部量子效率的注入电流依赖性表明,随着温度从6 K升高到350 K,除了非辐射复合增强外,电子溢出变得更加显著,特别是在高于300 K的较高温度范围内。