Department of Vascular Surgery, Institute of Vascular Surgery, Zhongshan Hospital, Fudan University, Shanghai, China.
Department of Vascular Surgery, Institute of Vascular Surgery, Zhongshan Hospital, Fudan University, Shanghai, China.
J Vasc Surg. 2018 Apr;67(4):1026-1033.e2. doi: 10.1016/j.jvs.2017.08.070. Epub 2017 Oct 31.
Stent graft (SG)-induced new entry (SINE) and retrograde type A dissection (RTAD) are serious device-related complications occurring after thoracic endovascular aortic repair (TEVAR) for Stanford type B aortic dissection (TBAD) and may lead to endograft-related complications including retrograde dissection and death. The purpose of this study was to investigate the incidence and risk factors for the development of RTAD and SINE after TEVAR for TBAD and to identify the complications associated with this.
From April 2005 to October 2013, there were 997 patients who underwent TEVAR for TBAD; 852 were followed up (0-6 years; mean, 2.6 years), and 59 SINEs developed in 53 patients. The oversizing ratio and incidence of RTAD and SINE were compared between proximal bare stent (PBS) and non-PBS groups and RTAD and SINE and non-RTAD and non-SINE groups. The baseline characteristics and SG configurational factors potentially affecting both RTAD and distal SINE were analyzed.
There was no significant difference between PBS and non-PBS groups in the incidence of RTAD. A greater oversizing ratio was related to a higher distal SINE rate. SINE was seen more frequently in smokers and in patients with hypertension, Marfan syndrome, and TEVAR in the chronic phase and less frequently in complicated dissection cases. Device-related factors for SINE were SG with a connecting bar and SG length <165 mm. The SG length <165 mm increased the overall proximal and distal SINE incidence in multivariate analysis.
The presence of a PBS is not associated with a higher RTAD rate, whereas the use of an SG with a connecting bar and length <165 mm increases the risk of RTAD and SINE after TEVAR.
支架移植物(SG)诱导的新入口(SINE)和逆行性 A 型夹层(RTAD)是胸主动脉腔内修复术(TEVAR)治疗 Stanford 型 B 型主动脉夹层(TBAD)后严重的与器械相关的并发症,可能导致移植物相关并发症,包括逆行夹层和死亡。本研究旨在探讨 TEVAR 治疗 TBAD 后发生 RTAD 和 SINE 的发生率和危险因素,并确定与之相关的并发症。
2005 年 4 月至 2013 年 10 月,共有 997 例患者接受 TEVAR 治疗 TBAD;852 例患者接受了随访(0-6 年;平均 2.6 年),53 例患者发生了 59 例 SINE。比较近端裸支架(PBS)和非 PBS 组、RTAD 和 SINE 组与非 RTAD 和非 SINE 组之间的放大率和 RTAD 和 SINE 的发生率。分析可能影响 RTAD 和远端 SINE 的基线特征和 SG 构型因素。
PBS 和非 PBS 组之间 RTAD 的发生率无显著差异。较大的放大率与远端 SINE 率较高相关。SINE 在吸烟者和高血压、马凡综合征患者以及慢性期 TEVAR 中更为常见,在复杂夹层病例中则较少见。SINE 的器械相关因素是带有连接条的 SG 和长度<165mm 的 SG。在多变量分析中,SG 长度<165mm 增加了近端和远端 SINE 的总发生率。
PBS 的存在与 RTAD 发生率较高无关,而使用带有连接条和长度<165mm 的 SG 会增加 TEVAR 后 RTAD 和 SINE 的风险。