Kirkland Earl J
School of Applied and Engineering Physics Cornell University Ithaca, NY 14853 USA.
Ultramicroscopy. 2018 Mar;186:62-65. doi: 10.1016/j.ultramic.2017.12.002. Epub 2017 Dec 12.
Aberration correctors offer greatly enhanced resolution in electron microscopes, however can require dramatically more complicated adjustments. A method of computer adjustment of a probe forming aberration corrector in a Scanning Transmission Electron Microscope (STEM) is proposed and analyzed using image simulation. This method works directly with the image and should work well with crystalline specimens. It does not have a significant dependence on post specimen lens aberrations.
