Kai Takeshi, Yokoya Akinari, Ukai Masatoshi, Fujii Kentaro, Toigawa Tomohiro, Watanabe Ritsuko
Nuclear Science and Engineering Center, Japan Atomic Energy Agency, 2-4 Shirane Shirakata, Tokai-mura, Naka-gun, Ibaraki, 319-1195, Japan.
Phys Chem Chem Phys. 2018 Jan 24;20(4):2838-2844. doi: 10.1039/c7cp06903k.
Although most of the radiation damage to genomic DNA could be rendered harmless using repair enzymes in a living cell, a certain fraction of the damage is persistent resulting in serious genetic effects, such as mutation induction. In order to understand the mechanisms of the deleterious DNA damage formation in terms of its earliest physical stage at the radiation track end, dynamics of low energy electrons and their thermalization processes around DNA molecules were investigated using a dynamic Monte Carlo code. The primary incident (1 keV) electrons multiply collide within 1 nm (equivalent to three DNA-base-pairs, 3bp) and generate secondary electrons which show non-Gaussian and non-thermal equilibrium distributions within 300 fs. On the other hand, the secondary electrons are mainly distributed within approximately 10 nm from their parent cations although approximately 5% of the electrons are localized within 1 nm of the cations owing to the interaction of their Coulombic fields. The mean electron energy is 0.7 eV; however, more than 10% of the electrons fall into a much lower-energy region than 0.1 eV at 300 fs. These results indicate that pre-hydrated electrons are formed from the extremely decelerated electrons over a few nm from the cations. DNA damage sites comprising multiple nucleobase lesions or single strand breaks can therefore be formed by multiple collisions of these electrons within 3bp. This multiple damage site is hardly processed by base excision repair enzymes. However, pre-hydrated electrons can also be produced resulting in an additional base lesion (or a strand break) more than 3bp away from the multi-damage site. These damage sites may be finally converted into a double strand break (DSB) when base excision enzymes process the additional base lesions. This DSB includes another base lesion(s) at their termini, and may introduce miss-rejoining by DSB repair enzymes, and hence may result in biological effects such as mutation in surviving cells.
虽然活细胞中的修复酶可使基因组DNA受到的大部分辐射损伤无害化,但仍有一定比例的损伤会持续存在,从而导致严重的遗传效应,如诱发突变。为了从辐射径迹末端最早的物理阶段来理解有害DNA损伤形成的机制,我们使用动态蒙特卡罗代码研究了低能电子在DNA分子周围的动力学及其热化过程。初级入射(1 keV)电子在1 nm(相当于三个DNA碱基对,3bp)内多次碰撞并产生二次电子,这些二次电子在300 fs内呈现非高斯和非热平衡分布。另一方面,二次电子主要分布在距其母阳离子约10 nm范围内,不过由于库仑场的相互作用,约5%的电子会局限在阳离子1 nm范围内。电子的平均能量为0.7 eV;然而,在300 fs时,超过10%的电子落入比0.1 eV低得多的能量区域。这些结果表明,预水合电子是由距阳离子几纳米处极度减速的电子形成的。因此,由这些电子在3bp内多次碰撞可形成包含多个核碱基损伤或单链断裂的DNA损伤位点。这种多损伤位点很难被碱基切除修复酶处理。然而,也会产生预水合电子,导致在距多损伤位点3bp以上的位置出现额外的碱基损伤(或链断裂)。当碱基切除酶处理这些额外的碱基损伤时,这些损伤位点最终可能转化为双链断裂(DSB)。这种DSB在其末端还包括其他碱基损伤,可能会导致DSB修复酶错配连接,进而可能在存活细胞中导致诸如突变等生物学效应。