Dubbink David, Koster Gertjan, Rijnders Guus
MESA+ Institute for Nanotechnology, University of Twente, Enschede, The Netherlands.
Sci Rep. 2018 Apr 10;8(1):5774. doi: 10.1038/s41598-018-24025-7.
The epitaxial growth of yttria-stabilized zirconia (YSZ) on silicon with native oxide was investigated in order to gain more insight in the growth mechanism. Specifically, attention was paid to the possibilities to control the chemical interactions between YSZ, silicon and oxygen during initial growth. The sources of oxygen during growth proved to play an important role in the growth process, as shown by individual manipulation of all sources present during Pulsed Laser Deposition. Partial oxidation of the YSZ plasma and sufficient delivery of oxygen to the growing film were necessary to prevent silicide formation and obtain optimal YSZ crystalline qualities. In these conditions, thickness increase of the silicon native oxide before growth just started to occur, while a much faster regrowth of silicon oxide at the YSZ-Si interface occurred during growth. Control of all these contributions to the growth process is necessary to obtain reproducible growth of high quality YSZ.
研究了在具有天然氧化物的硅上外延生长氧化钇稳定氧化锆(YSZ),以便更深入地了解生长机制。具体而言,重点关注了在初始生长过程中控制YSZ、硅和氧之间化学相互作用的可能性。如脉冲激光沉积过程中对所有存在的源进行单独操作所示,生长过程中的氧源在生长过程中起着重要作用。YSZ等离子体的部分氧化以及向生长薄膜充分输送氧气对于防止硅化物形成和获得最佳YSZ晶体质量是必要的。在这些条件下,生长开始前硅天然氧化物的厚度增加刚刚开始出现,而在生长过程中,YSZ - 硅界面处的氧化硅再生长速度要快得多。要实现高质量YSZ的可重复生长,必须控制生长过程中的所有这些因素。