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像差对受激发射损耗显微镜术中有效点扩散函数的影响。

Effects of aberrations on effective point spread function in STED microscopy.

作者信息

Li Yanghui, Zhou Hui, Liu Xiaoyu, Li Yuxue, Wang Le

出版信息

Appl Opt. 2018 May 20;57(15):4164-4170. doi: 10.1364/AO.57.004164.

Abstract

Like other imaging techniques, stimulated emission depletion (STED) microscopy suffers from aberrations. While their effects on depletion patterns have been explicitly investigated, the study on how aberrations affect the effective point spread function (PSF) in STED microscopy is still missing. For STED researchers, however, this study is beneficial, as it directly bridges image qualities and aberrations. In this paper, we quantitatively analyze the effects of primary aberrations, including astigmatism, coma, trefoil, and spherical aberration, in two-dimensional (2D) and three-dimensional (3D) STED microscopy, and further discuss the corresponding aberration tolerance. Specifically, attention is given to the modification of the shape, the size, and the peak intensity of the effective PSF in the presence of these aberrations.

摘要

与其他成像技术一样,受激辐射损耗(STED)显微镜也存在像差。虽然已经明确研究了像差对损耗图案的影响,但关于像差如何影响STED显微镜中有效点扩散函数(PSF)的研究仍然缺失。然而,对于STED研究人员来说,这项研究是有益的,因为它直接建立了图像质量和像差之间的联系。在本文中,我们定量分析了二维(2D)和三维(3D)STED显微镜中包括像散、彗差、三叶草像差和球差在内的初级像差的影响,并进一步讨论了相应的像差容限。具体而言,我们关注在存在这些像差的情况下有效PSF的形状、大小和峰值强度的变化。

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