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纳秒级 Cu/GeTe/TiN 细丝型忆阻器中的可重构逻辑,用于高能效的内存计算。

Reconfigurable logic in nanosecond Cu/GeTe/TiN filamentary memristors for energy-efficient in-memory computing.

机构信息

Wuhan National Research Center for Optoelectronics & School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan 430074, People's Republic of China.

出版信息

Nanotechnology. 2018 Sep 21;29(38):385203. doi: 10.1088/1361-6528/aacf84. Epub 2018 Jun 27.

Abstract

Owing to the capability of integrating the information storage and computing in the same physical location, in-memory computing with memristors has become a research hotspot as a promising route for non von Neumann architecture. However, it is still a challenge to develop high performance devices as well as optimized logic methodologies to realize energy-efficient computing. Herein, filamentary Cu/GeTe/TiN memristor is reported to show satisfactory properties with nanosecond switching speed (<60 ns), low voltage operation (<2 V), high endurance (>10 cycles) and good retention (>10 s @85 °C). It is revealed that the charge carrier conduction mechanisms in high resistance and low resistance states are Schottky emission and hopping transport between the adjacent Cu clusters, respectively, based on the analysis of current-voltage behaviors and resistance-temperature characteristics. An intuitive picture is given to describe the dynamic processes of resistive switching. Moreover, based on the basic material implication (IMP) logic circuit, we proposed a reconfigurable logic method and experimentally implemented IMP, NOT, OR, and COPY logic functions. Design of a one-bit full adder with reduction in computational sequences and its validation in simulation further demonstrate the potential practical application. The results provide important progress towards understanding of resistive switching mechanism and realization of energy-efficient in-memory computing architecture.

摘要

由于能够在同一物理位置集成信息存储和计算,基于忆阻器的内存计算已成为一种很有前途的非冯·诺依曼架构的研究热点。然而,开发高性能器件以及优化逻辑方法以实现节能计算仍然是一个挑战。在此,我们报道了丝状 Cu/GeTe/TiN 忆阻器具有令人满意的性能,其开关速度快(<60ns),工作电压低(<2V),耐久性好(>10 个循环),保持性好(>10s@85°C)。通过对电流-电压行为和电阻-温度特性的分析,发现高阻态和低阻态中的载流子输运机制分别为肖特基发射和相邻 Cu 簇之间的跳跃输运。此外,还提出了一种基于基本材料含义(IMP)逻辑电路的可重构逻辑方法,并进行了 IMP、NOT、OR 和 COPY 逻辑功能的实验验证。具有计算序列减少的一位全加器的设计及其在仿真中的验证进一步证明了其潜在的实际应用。这些结果为理解阻变机制和实现节能内存计算架构提供了重要进展。

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