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X 射线和频衍射技术用于超快电子动力学的直接成像。

X-Ray Sum Frequency Diffraction for Direct Imaging of Ultrafast Electron Dynamics.

机构信息

Department of Chemistry and Department of Physics and Astronomy, University of California, Irvine, California 92697, USA.

出版信息

Phys Rev Lett. 2018 Jun 15;120(24):243902. doi: 10.1103/PhysRevLett.120.243902.

Abstract

X-ray diffraction from molecules in the ground state produces an image of their charge density, and time-resolved x-ray diffraction can thus monitor the motion of the nuclei. However, the density change of excited valence electrons upon optical excitation can barely be monitored with regular diffraction techniques due to the overwhelming background contribution of the core electrons. We present a nonlinear x-ray technique made possible by novel free electron laser sources, which provides a spatial electron density image of valence electron excitations. The technique, sum frequency generation carried out with a visible pump and a broadband x-ray diffraction pulse, yields snapshots of the transition charge densities, which represent the electron density variations upon optical excitation. The technique is illustrated by ab initio simulations of transition charge density imaging for the optically induced electronic dynamics in a donor or acceptor substituted stilbene.

摘要

X 射线从基态分子衍射产生它们的电荷密度图像,而时间分辨的 X 射线衍射因此可以监测核的运动。然而,由于核心电子的压倒性背景贡献,常规衍射技术几乎无法监测光激发后激发价电子的密度变化。我们提出了一种由新型自由电子激光源实现的非线性 X 射线技术,该技术提供了价电子激发的空间电子密度图像。该技术是通过可见泵浦和宽带 X 射线衍射脉冲进行的和频产生,得到了跃迁电荷密度的快照,它代表了光激发时电子密度的变化。该技术通过对供体或受体取代的二苯乙烯中光诱导电子动力学的跃迁电荷密度成像的从头算模拟进行了说明。

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