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利用边缘照明进行弱 X 射线散射的提取。

Retrieval of weak x-ray scattering using edge illumination.

出版信息

Opt Lett. 2018 Aug 15;43(16):3874-3877. doi: 10.1364/OL.43.003874.

Abstract

X-ray phase contrast imaging provides additional modes of image contrast compared to conventional attenuation-based x-ray imaging, thus providing additional structural and functional information about the sample. The edge-illumination (EI) technique has been used to provide attenuation, refraction, and scattering contrast in both biological and non-biological samples. However, the retrieval of low scattering signals by fitting a single Gaussian remains problematic, principally due to the inability of the EI system to achieve perfect dark-field illumination. We present a new retrieval method that fits three Gaussians, which successfully overcomes this limitation, and provide examples of the retrieval of such signals in highly absorbing, weakly scattering samples.

摘要

X 射线相衬成像是一种与传统基于衰减的 X 射线成像相比提供更多图像对比模式的技术,因此可以提供有关样品的额外结构和功能信息。边缘照明(EI)技术已被用于提供生物和非生物样品中的衰减、折射和散射对比。然而,通过拟合单个高斯函数来提取低散射信号仍然存在问题,主要是由于 EI 系统无法实现完美的暗场照明。我们提出了一种新的拟合三个高斯函数的检索方法,该方法成功地克服了这一限制,并提供了在高度吸收、弱散射样品中提取此类信号的实例。

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