Zamir Anna, Hagen Charlotte, Diemoz Paul C, Endrizzi Marco, Vittoria Fabio, Chen Yujia, Anastasio Mark A, Olivo Alessandro
University College London, Department of Medical Physics and Biomedical Engineering, London, United Kingdom.
Washington University in St. Louis, Department of Biomedical Engineering, St. Louis, Missouri, United States.
J Med Imaging (Bellingham). 2017 Oct;4(4):040901. doi: 10.1117/1.JMI.4.4.040901. Epub 2017 Oct 16.
Edge illumination (EI) is an x-ray phase-contrast imaging technique, exploiting sensitivity to x-ray refraction to visualize features, which are often not detected by conventional absorption-based radiography. The method does not require a high degree of spatial coherence and is achromatic and, therefore, can be implemented with both synchrotron radiation and commercial x-ray tubes. Using different retrieval algorithms, information about an object's attenuation, refraction, and scattering properties can be obtained. In recent years, a theoretical framework has been developed that enables EI computed tomography (CT) and, hence, three-dimensional imaging. This review provides a summary of these advances, covering the development of different image acquisition schemes, retrieval approaches, and applications. These developments constitute an integral part in the transformation of EI CT into a widely spread imaging tool for use in a range of fields.
边缘照明（EI）是一种X射线相衬成像技术，它利用对X射线折射的敏感性来可视化特征，而这些特征通常是传统基于吸收的射线照相术所无法检测到的。该方法不需要高度的空间相干性，并且是消色差的，因此可以使用同步辐射和商用X射线管来实现。通过使用不同的检索算法，可以获得有关物体衰减、折射和散射特性的信息。近年来，已经开发出一种理论框架，使得EI计算机断层扫描（CT）成为可能，从而实现三维成像。本综述总结了这些进展，涵盖了不同图像采集方案、检索方法和应用的发展。这些进展是EI CT转变为广泛应用于一系列领域的成像工具的一个组成部分。
