Department of Materials Science, Fudan University, Shanghai 200433, P. R. China.
Phys Chem Chem Phys. 2018 Nov 7;20(41):26453-26462. doi: 10.1039/c8cp04743j. Epub 2018 Oct 11.
A novel dielectric material of monolayer 1T-HfO has been investigated using first-principles calculations. The stability of 1T-HfO has been proved by both phonon dispersions and ab initio molecular dynamics calculations, although its 2H structural counterpart is dynamically unstable. 1T-HfO monolayer can be cleaved from the (111) facet of cubic HfO. It is found that 1T-HfO has a large band gap of 6.73 eV, exceeding the band gaps of h-BN (5.97 eV) and bulk HfO (5.7 eV). From the microscopic perspective of dielectric polarization, we provide an explanation for the dependence of the dielectric constant directly calculated from the supercell of a two-dimensional (2D) system on the variable vacuum spacing, and we thus obtain a rational method for accurately evaluating the dielectric constants of 2D materials based on the calculated value obtained from a supercell to meet periodic conditions. Our derivation can be verified by the data fitting of a series of calculations with different vacuum spacings. The static dielectric constants of 1T-HfO along the in-plane and out-of-plane directions are 27.35 and 4.80, respectively, higher than those of monolayer h-BN. The large band gap and high dielectric constant make 1T-HfO a promising candidate as a dielectric layer in 2D field-effect transistors and heterojunctions.
采用第一性原理计算研究了单层 1T-HfO 的新型介电材料。通过声子色散和从头分子动力学计算证明了 1T-HfO 的稳定性,尽管其 2H 结构对应物在动力学上是不稳定的。1T-HfO 单层可以从立方 HfO 的(111)面剥离。研究发现,1T-HfO 的带隙为 6.73eV,超过了 h-BN(5.97eV)和体相 HfO(5.7eV)的带隙。从介电极化的微观角度出发,我们对从二维(2D)系统超胞直接计算的介电常数对可变真空间距的依赖性给出了一个解释,从而为基于超胞获得的计算值得到了一种准确评估二维材料介电常数的合理方法,以满足周期性条件。我们的推导可以通过一系列不同真空间距计算的数据拟合来验证。1T-HfO 在面内和面外方向上的静态介电常数分别为 27.35 和 4.80,均高于单层 h-BN。大的带隙和高的介电常数使 1T-HfO 成为二维场效应晶体管和异质结中介电层的有前途的候选材料。