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用于偏振光束分析的广义哈特曼-夏克介质透镜子阵列。

Generalized Hartmann-Shack array of dielectric metalens sub-arrays for polarimetric beam profiling.

机构信息

Wuhan National Laboratory for Optoelectronics, School of Optical and Electronic Information, Huazhong University of Science and Technology (HUST), 430074, Wuhan, Hubei, China.

Institute of Nanotechnology and Institute of Applied Physics, Karlsruhe Institute of Technology (KIT), 76021, Karlsruhe, Germany.

出版信息

Nat Commun. 2018 Nov 2;9(1):4607. doi: 10.1038/s41467-018-07056-6.

Abstract

To define and characterize optical systems, obtaining the amplitude, phase, and polarization profile of optical beams is of utmost importance. Traditional polarimetry is well established to characterize the polarization state. Recently, metasurfaces have successfully been introduced as compact optical components. Here, we take the metasurface concept to the system level by realizing arrays of metalenses, allowing the determination of the polarization profile of an optical beam. We use silicon-based metalenses with a numerical aperture of 0.32 and a mean measured focusing efficiency in transmission mode of 28% at a wavelength of 1550 nm. Our system is extremely compact and allows for real-time beam diagnostics by inspecting the foci amplitudes. By further analyzing the foci displacements in the spirit of a Hartmann-Shack wavefront sensor, we can simultaneously detect phase-gradient profiles. As application examples, we diagnose the profiles of a radially polarized beam, an azimuthally polarized beam, and of a vortex beam.

摘要

为了定义和描述光学系统,获取光束的振幅、相位和偏振分布至关重要。传统的偏振测量技术已被广泛应用于描述偏振态。最近,超表面已成功地被引入作为紧凑的光学元件。在这里,我们通过实现金属透镜阵列,将超表面的概念应用于系统级,从而可以确定光束的偏振分布。我们使用基于硅的金属透镜,数值孔径为 0.32,在 1550nm 波长下传输模式的平均测量聚焦效率为 28%。我们的系统非常紧凑,通过检查焦点幅度可以实现实时光束诊断。通过进一步分析哈特曼-夏克波前传感器的焦点位移,可以同时检测相位梯度分布。作为应用实例,我们诊断了径向偏振光束、角向偏振光束和涡旋光束的分布。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/a9df/6214988/9be11fbaebd0/41467_2018_7056_Fig1_HTML.jpg

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