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探究离子注入诱导缺陷对块状二硫化钼储能性能的影响。

Interrogating the effects of ion-implantation-induced defects on the energy storage properties of bulk molybdenum disulphide.

机构信息

School of Physics, University of the Witwatersrand, Private Bag 3, Wits 2050, Johannesburg, South Africa.

出版信息

Phys Chem Chem Phys. 2018 Nov 14;20(44):28232-28240. doi: 10.1039/c8cp05384g.

Abstract

The effects of implanted molybdenum and tungsten ions on the energy-storage properties of electrodes made from bulk molybdenum disulphide (MoS2) have been investigated. Six samples of crystalline MoS2 were modified by an ion-implantation strategy: three samples with Mo ions and three with W ions, at varying fluences and at an energy of 10 keV. The Stopping and Range of Ions in Matter (SRIM) software was used to determine the simulated defect density in terms of vacancies and the implanted ion-penetration depth. Raman spectroscopy and photoluminescence spectroscopy were used to determine any changes in the material as a result of irradiation. Electrochemistry showed that the ion-implanted MoS2 samples exhibited significant energy storage properties (such as capacity, cycling stability, coulombic efficiency, and electron transfer kinetics) compared to the pristine MoS2 samples, confirming the effects of defects induced by ion-implantation.

摘要

研究了植入的钼和钨离子对块状二硫化钼(MoS2)电极储能性能的影响。采用离子注入策略对 6 个结晶 MoS2 样品进行了改性:3 个样品注入 Mo 离子,3 个样品注入 W 离子,注入剂量和能量分别为 10keV 和 10keV。利用 Stopping and Range of Ions in Matter(SRIM)软件确定了空位和注入离子穿透深度的模拟缺陷密度。拉曼光谱和光致发光光谱用于确定辐照对材料的任何变化。电化学表明,与原始 MoS2 样品相比,离子注入 MoS2 样品表现出显著的储能性能(如容量、循环稳定性、库仑效率和电子转移动力学),证实了离子注入引起的缺陷的影响。

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