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退火温度对溶胶-凝胶法制备的三氧化钨薄膜光学带隙的影响

Effects of Annealing Temperature on Optical Band Gap of Sol-gel Tungsten Trioxide Films.

作者信息

Zhang Guanguang, Lu Kuankuan, Zhang Xiaochen, Yuan Weijian, Shi Muyang, Ning Honglong, Tao Ruiqiang, Liu Xianzhe, Yao Rihui, Peng Junbiao

机构信息

Institute of Polymer Optoelectronic Materials and Devices, State Key Laboratory of Luminescent Materials and Devices, South China University of Technology, Guangzhou 510640, China.

出版信息

Micromachines (Basel). 2018 Jul 30;9(8):377. doi: 10.3390/mi9080377.

Abstract

Tungsten trioxide (WO₃) is a wide band gap semiconductor material that is used as an important electrochromic layer in electrochromic devices. In this work, the effects of the annealing temperature on the optical band gap of sol-gel WO₃ films were investigated. X-ray Diffraction (XRD) showed that WO₃ films were amorphous after being annealed at 100 °C, 200 °C and 300 °C, respectively, but became crystallized at 400 °C and 500 °C. An atomic force microscope (AFM) showed that the crystalline WO₃ films were rougher than the amorphous WO₃ films (annealed at 200 °C and 300 °C). An ultraviolet spectrophotometer showed that the optical band gap of the WO₃ films decreased from 3.62 eV to 3.30 eV with the increase in the annealing temperature. When the Li⁺ was injected into WO₃ film in the electrochromic reaction, the optical band gap of the WO₃ films decreased. The correlation between the optical band gap and the electrical properties of the WO₃ films was found in the electrochromic test by analyzing the change in the response time and the current density. The decrease in the optical band gap demonstrates that the conductivity increases with the corresponding increase in the annealing temperature.

摘要

三氧化钨(WO₃)是一种宽带隙半导体材料,在电致变色器件中用作重要的电致变色层。在本工作中,研究了退火温度对溶胶 - 凝胶法制备的WO₃薄膜光学带隙的影响。X射线衍射(XRD)表明,WO₃薄膜在分别于100℃、200℃和300℃退火后为非晶态,但在400℃和500℃时结晶。原子力显微镜(AFM)显示,结晶态的WO₃薄膜比非晶态的WO₃薄膜(在200℃和300℃退火)更粗糙。紫外可见分光光度计表明,WO₃薄膜的光学带隙随着退火温度的升高从3.62 eV降至3.30 eV。在电致变色反应中,当Li⁺注入WO₃薄膜时,WO₃薄膜的光学带隙减小。通过分析响应时间和电流密度的变化,在电致变色测试中发现了WO₃薄膜光学带隙与电学性质之间的相关性。光学带隙的减小表明,随着退火温度相应升高,电导率增加。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/56e8/6187586/ecd6c72f809c/micromachines-09-00377-g001.jpg

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